2017
DOI: 10.1103/physrevb.95.195209
|View full text |Cite
|
Sign up to set email alerts
|

Point defect segregation and its role in the detrimental nature of Frank partials inCu(In,Ga)Se2thin-film absorbers

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1

Citation Types

0
4
0

Year Published

2017
2017
2024
2024

Publication Types

Select...
5

Relationship

1
4

Authors

Journals

citations
Cited by 13 publications
(4 citation statements)
references
References 31 publications
0
4
0
Order By: Relevance
“…In contrast, (partial) dislocations were shown to exhibit regions with changes in composition which extend over several nm . At these line defects, strain fields were found to induce substantial outdiffusion of Cu (Cu i defects), probably in order to relax the crystal lattice correspondingly, in addition to In Cu 2+ antisites present in areas under compressive strain . Therefore, in the case of (partial) dislocations, the change in composition results in an extended phase around the dislocation cores of several nm in diameter.…”
Section: Spatial Variations In Composition and Influences On Local Bamentioning
confidence: 96%
“…In contrast, (partial) dislocations were shown to exhibit regions with changes in composition which extend over several nm . At these line defects, strain fields were found to induce substantial outdiffusion of Cu (Cu i defects), probably in order to relax the crystal lattice correspondingly, in addition to In Cu 2+ antisites present in areas under compressive strain . Therefore, in the case of (partial) dislocations, the change in composition results in an extended phase around the dislocation cores of several nm in diameter.…”
Section: Spatial Variations In Composition and Influences On Local Bamentioning
confidence: 96%
“…No spectra could be recorded on unetched films and Cu-rich films after weak etching, due to the presence of the conductive Cu-Se phases at the surface. A recent DFT study by Simsek Sanli et al 54 on the effect of Cu In antisites and Cu interstitials in CIS reveals the appearance of states at 270 meV above the valence band maximum and 210 meV below the conduction band minimum, respectively. However, it is not obvious why the population of these two defects would increase upon KCN etching.…”
Section: Optoelectronics Of Cis Metastability Induced By Cyanidementioning
confidence: 99%
“…However, Sanli et al found fluctuations in the Cu component in dislocation cores at the ends of the stacking faults. Decoration of these dislocation cores induced the formation of deep defect states . Relevant APT research showed the presence of Cu enrichment/depletion at stacking faults, but no cosegregation of Na, K, and O .…”
Section: Other Thin-film Solar Cellsmentioning
confidence: 99%
“…Decoration of these dislocation cores induced the formation of deep defect states. 171 Relevant APT research showed the presence of Cu enrichment/ depletion at stacking faults, but no cosegregation of Na, K, and O. 169 Due to the multicomponent feature of CIGS, its compositional fluctuations require further investigation.…”
Section: ■ Other Thin-film Solar Cellsmentioning
confidence: 99%