Polarimeter for Detection of Anisotropy from Reflectance

Abstract

Polarimetry is used to determine the Stokes parameters of a laser beam. Once all four S0,1,2,3 parameters are determined, the state of polarisation is established. Upon reflection of a laser beam with the defined S polarisation state, the directly measured S parameters can be used to determine the optical properties of the surface, which modified the S-state upon reflection. Here, we demonstrate polarimetry for the determination of surface anisotropies related to birefringence and dichroism from different materials, which have a common feature of linear patterns of different alignments and scales. It is shown that polarimetry in the back-reflected light is complementary to ellipsometry and four-polarisation camera imaging.