Polarimetric and Other Optical Probes for the Solid–Liquid Interface

Hingerl, Kurt

doi:10.1007/978-3-642-33956-1_14

Cited by 3 publications

(2 citation statements)

References 50 publications

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“…If there is "no-one-solves-all" technique, Spectroscopic Ellipsometry (SE) can undoubtedly participate to efforts to the knowledge of a global picture of the liquid-solid interface 1 as it is the case for passive oxide on metals. [2][3][4][5][6][7][8][9] It can bridge some of the inherent difficulties investigating such oxide growth mechanisms as pointed by MacDonald 10,11 viz.…”

Section: Introductionmentioning

confidence: 99%

In situ spectroelectrochemical ellipsometry using super continuum white laser: Study of the anodization of magnesium alloy

Zimmer

Veys‐Renaux

Broch

et al. 2019

Journal of Vacuum Science &Amp; Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phen

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This work shows the interest to use a real time white laser-based ellipsometer to characterize complex electrolyte | electrode interface during electrochemical process in aqueous-based medium. This method is proposed to probe electrochemical interfaces which are usually not suitable to the full extent application of ellipsometry due to great disturbance of the reflected light flux provoked by gas evolution or roughness. In situ spectroelectrochemical ellipsometry combining such a visible super continuum fiber laser-band source was not previously reported to the best of the authors' knowledge. The setup was employed to monitor an electrochemical process whose the mechanism was previously incompletely described: the pre-spark anodization regime of plasma electrolytic oxidation process of Mg alloy AZ91D in 3 M KOH electrolyte. Above the anodization voltage of 4 V, the side water oxidation reaction induced light diffusion that reduces reflected light beam intensity. The process is here monitored in an extended

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Section: Introductionmentioning

confidence: 99%

In situ spectroelectrochemical ellipsometry using super continuum white laser: Study of the anodization of magnesium alloy

Zimmer

Veys‐Renaux

Broch

et al. 2019

Journal of Vacuum Science &Amp; Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phen

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“…A survey of the scientific literature and industrial applications reveals that spectroscopic ellipsometry is applied mostly to characterize solids and generally thin film samples with a more or less complex structure [1]. Ellipsometry has also been applied to study solids in liquid ambients [2] and liquid-liquid or air-liquid interfaces [3][4][5][6] but to our knowledge, there has not been an application of ellipsometry to efficiently characterize real and imaginary parts of the complex refractive index of the actual liquids. There are several reasons for this, the most realistic one being 2 that for liquids, transmission spectroscopy remains the reference technique, allowing reasonably good determination of the extinction coefficient.…”

Section: Introductionmentioning

confidence: 99%

An original method to determine complex refractive index of liquids by spectroscopic ellipsometry and illustrated applications

Stchakovsky

Battie

Naciri

2017

Applied Surface Science

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In Situ Characterization of Biomaterials at Solid‐Liquid Interfaces Using Ellipsometry in the UV‐Visible‐NIR Wavelength Range

Kalas

Agócs

Romanenko

et al. 2019

Physica Status Solidi (a)

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Understanding interface processes has been gaining crucial importance in many applications of biology, chemistry, and physics. The boundaries of those disciplines had been quickly vanishing in the last decade, as metrologies and the knowledge gained based on their use improved and increased rapidly. Optical techniques such as microscopy, waveguide sensing, or ellipsometry are significant and widely used means of studying solid‐liquid interfaces because the applicability of ions, electrons, or X‐ray radiation is strongly limited for this purpose due to the high absorption in aqueous ambient. Light does not only provide access to the interface making the measurement possible, but utilizing the phase information and the large amount of spectroscopic data, the ellipsometric characterization is also highly sensitive and robust. This article focuses on ellipsometry of biomaterials in the visible wavelength range. The authors discuss the main challenges of measuring thickness and optical properties of ultra‐thin films such as biomolecules. The authors give an overview on different kinds of flow cells from conventional through internal reflection to combined methods. They emphasize that surface nanostructures and evaluation strategies are also crucial parts of in situ bioellipsometry and summarize some of the recent trends showing examples mainly from their research.

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Polarimetric and Other Optical Probes for the Solid–Liquid Interface

Cited by 3 publications

References 50 publications

In situ spectroelectrochemical ellipsometry using super continuum white laser: Study of the anodization of magnesium alloy

In situ spectroelectrochemical ellipsometry using super continuum white laser: Study of the anodization of magnesium alloy

An original method to determine complex refractive index of liquids by spectroscopic ellipsometry and illustrated applications

In Situ Characterization of Biomaterials at Solid‐Liquid Interfaces Using Ellipsometry in the UV‐Visible‐NIR Wavelength Range

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