Photonic Crystal Fibers 2007
DOI: 10.1117/12.722017
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Polaritonic resonances in 2D silicon photonic crystals

Abstract: Polaritonic resonancies are investigated in 2D silicon photonic crystals. Theoretically unpredicted reduction in the transmittance of electromagnetic radiation and the step formation are observed for wavelengths less than optical period of structures due to directed and decay optical modes formed by macroporous silicon as a short waveguide structure. Prevalence of absorption over reflection of light testify to the polaritonic type band formation. Surface polaritons are formed on decay modes in a silicon matrix… Show more

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Cited by 1 publication
(3 citation statements)
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“…The main cause of stress is a significant difference in temperature expansion coefficients of Si ( ) and, consequently, a larger volume of phases SiO 2 and SiO x as compared to monocrystalline silicon. The direct optical transition energy of the unstrained silicon surface is 3.38 eV [5]. Thus, the maximum deviation from that of the unstrained silicon surface is 90 meV for samples with the CdS nanocoating and the oxide thickness 30 nm as well as for samples with the ZnO nanocoating with the oxide thickness 15 nm.…”
Section: Electroreflectance Spectramentioning
confidence: 75%
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“…The main cause of stress is a significant difference in temperature expansion coefficients of Si ( ) and, consequently, a larger volume of phases SiO 2 and SiO x as compared to monocrystalline silicon. The direct optical transition energy of the unstrained silicon surface is 3.38 eV [5]. Thus, the maximum deviation from that of the unstrained silicon surface is 90 meV for samples with the CdS nanocoating and the oxide thickness 30 nm as well as for samples with the ZnO nanocoating with the oxide thickness 15 nm.…”
Section: Electroreflectance Spectramentioning
confidence: 75%
“…The electroreflectance spectra were measured by the standard electrolytic technique at room temperature. It is evident from the figures that all the electroreflectance spectra correspond to silicon of n-type conductivity, while the electroreflectance spectra of macroporous silicon structures correspond to the surface of p-type conductivity silicon [5] due to its passivation by hydrogen atoms. High-energy Franz-Keldysh oscillations [5] with the photon energy higher 3.6 eV indicate the presence of the built-in electric field for CdS and ZnO nanocrystals on silicon oxide with the thickness 15 and 30 nm (Fig.…”
Section: Electroreflectance Spectramentioning
confidence: 99%
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