1993
DOI: 10.1016/0168-9002(93)91122-4
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Polarization analyses of elliptically-polarized vacuum-ultraviolet undulator radiation

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Cited by 24 publications
(6 citation statements)
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“…which are typically used to characterize the degree of polarization (Bahrdt et al, 2010;Finetti et al, 2004;Koide et al, 1993Koide et al, , 1991Nahon and Alcaraz, 2004;Nahon et al, 2012;Saito et al, 2014;Uschakow et al, 2013;Yamamoto et al, 2014). Using Eq.…”
Section: Elliptically Polarized Lightmentioning
confidence: 99%
“…which are typically used to characterize the degree of polarization (Bahrdt et al, 2010;Finetti et al, 2004;Koide et al, 1993Koide et al, , 1991Nahon and Alcaraz, 2004;Nahon et al, 2012;Saito et al, 2014;Uschakow et al, 2013;Yamamoto et al, 2014). Using Eq.…”
Section: Elliptically Polarized Lightmentioning
confidence: 99%
“…15 At shorter wavelengths it is necessary to use reflection-based polarimeters such as the one developed at the Photon Factory by Koide et al, who measured P c ϳ 80% in the 60 -80-eV range on the BL11D beam line 16 and 55-90% in the 50 -80-eV range on the BL28 beam line. 17 Further into the soft-x-ray range, a polarimeter based on transmission and reflections with multilayer optics 18 was used to commission several beam lines at the Berlin Electron Storage Ring ͑BESSY͒ and ELETTRA operating in the water-window range.…”
Section: Introductionmentioning
confidence: 99%
“…A method for evaluating the polarization characteristics of incident light in this range is therefore an important concern in the synchrotron community. The diagnosis of the polarization state can be precisely made with an optical method using polarimeters (Gaupp & Mast, 1989;Koide et al, 1991Koide et al, , 1993Schä fers et al, 1999;Finetti et al, 2004;Nahon & Alcaraz, 2004). Such a measurement, however, requires stringent alignment of the polarimeters, and the fabrication and manipulation of an effective polarimeter system are still challenging.…”
Section: Introductionmentioning
confidence: 99%