Polarization control scheme for surface plasmon and optical guided mode control detection

Velinov, T.; Bivolarska, Maria; Russev, Stoyan C.; Bransalov, K. P.; Somekh, Michael Geoffrey

doi:10.1016/j.snb.2004.02.001

Cited by 4 publications

(4 citation statements)

References 18 publications

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“…3. Except for the imaging system the other elements are as described elsewhere (Velinov et al ., 2004). With the help of the polarizer and compensator the light was elliptically polarized so that, after reflection from the sample, it became linearly polarized.…”

Section: Methodsmentioning

confidence: 99%

“…It has been demonstrated that the PCSA scheme is more sensitive to variations in the refractive indices of wave‐guide structures and the adjacent media than the standard Kretschmann configuration (Velinov et al ., 2004). The results presented in the next section show that pictures taken with imaging ellipsometry at angles of the incident light near the angle of resonant excitation of a guided mode are also of better quality than the conventional GW microscopy.…”

Section: Theoretical Considerationsmentioning

confidence: 99%

“…In a previous work, we presented a scheme for guided mode detection that combines the Kretschmann configuration with the polarizer–compensator, sample–analyser (PCSA) scheme used in ellipsometry (Velinov et al ., 2004). It was shown to have higher sensitivity than the measurement of only the intensity of the reflected light and at the same time is simple, robust and requires no additional image processing, as distinct from phase‐sensitive methods using Mach‐Zehnder interferometry (Notcovich et al ., 2000).…”

Section: Introductionmentioning

confidence: 99%

See 2 more Smart Citations

Guided‐wave and ellipsometric imaging of supported cells

Bivolarska

Velinov

Stoitsova

2006

Journal of Microscopy

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SummaryIn this study, results are reported from guided-wave microscopy and imaging ellipsometry near the angle of resonant excitation of an optical guided mode in planar wave guides with metal and dielectric layers. The main goal was to test their ability to detect micro-organisms (Escherichia coli) attached to a support. For this purpose, images from the two techniques were compared with an optical image and good agreement was found. The reasons for the differences between the pictures obtained with wave-guide microscopy and imaging ellipsometry were investigated and it was found that both the reduced plasmon propagation length and the use of additional polarizing elements contributed to the improved quality of the latter.

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Section: Methodsmentioning

confidence: 99%

Section: Theoretical Considerationsmentioning

confidence: 99%