2006
DOI: 10.1103/physrevb.74.104112
|View full text |Cite
|
Sign up to set email alerts
|

Polarization relaxation in thin-film relaxors compared to that in ferroelectrics

Abstract: were prepared, and their dielectric properties were studied in a broad range of the measurement conditions. In the ferroelectric state, the presence and the change of configuration of the domains determined both the dynamic dielectric nonlinearity and the polarization hysteresis. In thin-film relaxors, the orientation of the randomly interacting dipoles in a random field was responsible for the dynamic dielectric nonlinearity, while the observed hysteresis was suggested to arise due to connection between the a… Show more

Help me understand this report
View preprint versions

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1
1

Citation Types

2
28
0

Year Published

2007
2007
2013
2013

Publication Types

Select...
6
1
1

Relationship

2
6

Authors

Journals

citations
Cited by 28 publications
(30 citation statements)
references
References 42 publications
2
28
0
Order By: Relevance
“…These findings indicate that the most likely reason for the ferroelectricity is a small amount of Sr deficiency in our nominally stoichiometric STO films. A clear distinction between STO and previously reported relaxor systems by A-site cation doping [28][29][30][31] is that STO has only Sr on the A site with minute amounts of unintentional Sr deficiency.…”
mentioning
confidence: 73%
“…These findings indicate that the most likely reason for the ferroelectricity is a small amount of Sr deficiency in our nominally stoichiometric STO films. A clear distinction between STO and previously reported relaxor systems by A-site cation doping [28][29][30][31] is that STO has only Sr on the A site with minute amounts of unintentional Sr deficiency.…”
mentioning
confidence: 73%
“…In thin films, the difference is well seen in the dependence of the response on amplitude E ac of ac electric field, C=S (E ac ) [22]. This can be used to reveal the presence of FE domains.…”
Section: -2mentioning
confidence: 93%
“…The dispersion can hardly be ascribed to a Maxwell-Wagner relaxation shown to result in a considerably larger variation of Ј and tan ␦ with f. 21 The peaks in Fig. 3 resemble those typically observed in thin-film heterostructures of perovskite relaxors 16 and also BST films. 22 The maximum permittivity m Ј ͑i.e., that measured at temperature T m ͒ varies with frequency ͓Fig.…”
Section: A Dielectric Permittivitymentioning
confidence: 70%
“…The time 0 can qualitatively be related to the height of barriers between different dipole orientations. 24 By analogy with thin-film relaxors, 16 the decrease of T f and the increase of f 0 ͑decrease of 0 ͒ indicate changes in relaxation time spectra.…”
Section: B Temperature Of Transitionmentioning
confidence: 99%
See 1 more Smart Citation