Polarization-Resolved Near-Field Mapping of Plasmonic Aperture Emission by a Dual-SNOM System

Klein, Angela E.; Janunts, Norik; Steinert, Michael; Tünnermann, Andreas; Pertsch, Thomas

doi:10.1021/nl501431y

Cited by 36 publications

(29 citation statements)

References 49 publications

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“…For such aperture SNOMs, which we study in this investigation, it was predicted and proven that detected signals are influenced by both the transverse electric and magnetic components of the investigated field [5][6][7][8][9][10]. Depending on the measurement configuration, a detected signal can be influenced dominantly by either the transverse electric, magnetic, or both field components [5][6][7][10][11][12][13][14][15][16][17][18][19][20][21][22][23][24][25][26][27]. Nevertheless, analytical expressions that allow the evaluation of the sensitivity of a probe to the individual investigated field components is missing.…”

Section: Introductionmentioning

confidence: 81%

Image formation properties and inverse imaging problem in aperture based scanning near field optical microscopy

Schmidt¹,

Klein²,

Paul³

et al. 2016

Opt. Express

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Aperture based scanning near field optical microscopes are important instruments to study light at the nanoscale and to understand the optical functionality of photonic nanostructures. In general, a detected image is affected by both the transverse electric and magnetic field components of light. The discrimination of the individual field components is challenging as these four field components are contained within two signals in the case of a polarization resolved measurement. Here, we develop a methodology to solve the inverse imaging problem and to retrieve the vectorial field components from polarization and phase resolved measurements. Our methodology relies on the discussion of the image formation process in aperture based scanning near field optical microscopes. On this basis, we are also able to explain how the relative contributions of the electric and magnetic field components within detected images depend on the chosen probe. We can therefore also describe the influence of geometrical and material parameters of individual probes within the image formation process. This allows probes to be designed that are primarily sensitive either to the electric or magnetic field components of light.

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Section: Introductionmentioning

confidence: 81%

Image formation properties and inverse imaging problem in aperture based scanning near field optical microscopy

Schmidt¹,

Klein²,

Paul³

et al. 2016

Opt. Express

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show abstract

“…Compared with widely used AFM for micro/nanomanipulation, the significant advantage of ShFM is that it is easily combined with SNOM to detect near-field optical properties of the samples with its fibre probe (Betzig et al, 1992;Toledo-Crow et al, 1992). Moreover, it is possible to develop multiprobes SNOM systems (Nakayama et al, 2012;Klein et al, 2014) for application of imaging and manipulating complex structures based on ShFM.…”

Section: Introductionmentioning

confidence: 99%

Direct manipulation of metallic nanosheets by shear force microscopy

Cai

Wang

et al. 2018

Journal of Microscopy

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Micro/nanomanipulation is a rapidly growing technology and holds promising applications in various fields, including photonic/electronic devices, chemical/biosensors etc. In this work, we present that shear force microscopy (ShFM) can be exploited to manipulate metallic nanosheets besides imaging. The manipulation is realized via controlling the shear force sensor probe position and shear force magnitude based on our homemade ShFM system under an optical microscopy for in situ observation. The main feature of the ShFM system is usage of a piezoelectric bimorph sensor, which has the ability of self-excitation and detection. Moreover, the shear force magnitude as a function of the spring constant of the sensor and setpoint is obtained, which indicates that operation modes can be switched between imaging and manipulation through designing the spring constant before experiment and changing the setpoint during manipulation process, respectively. We believe that this alternative manipulation technique could be used to assemble other nanostructures with different shapes, sizes and compositions for new properties and wider applications.

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“…Many studies have been carried out to explain the light transmission or detection processes with aperture SNOM tips [8][9][10][11][12][13][14][15][16][17][18][19][20][21][22][23][24][25][26]. For example, dipole and multipole models has been widely used for describing the diffracted fields through the sub-wavelength circular aperture of SNOM tips [8][9][10][11][12][13][14][15][16][17][18][19][20]. These theories are based on Bethe-Bouwkamp theory that describes the diffraction of a normal incident plane wave through a sub-wavelength metallic hole as a magnetic dipole oscillating in the plane of the aperture [8,9].…”

Section: Introductionmentioning

confidence: 99%

Quasi-linearly polarized hybrid modes in tapered and metal-coated tips with circular apertures: understanding the functionality of aperture tips

et al. 2017

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In this study, we investigate analytically and experimentally the roles of quasi-linearly polarized (LP), hybrid, plasmonic and photonic modes in optical detection and excitation with aperture tips in scanning near-field optical microscopy. Aperture tips are tapered and metal-coated optical fibers where small circular apertures are made at the apex. In aperture tips, there exist plasmonic modes that are bound at the interface of the metal cladding to the inner dielectric fiber and photonic modes that are guided in the area of the increased index in the dielectric fiber core. The fundamental photonic mode, although excited by the free-space Gaussian beam, experiences cutoff and turns into an evanescent mode. The photonic mode also becomes lossier than the plasmonic mode toward the tip aperture, and its power decay due to absorption and reflection is expected to be at least 10 −9 . In contrast, the fundamental plasmonic mode has no cutoff and thus reaches all the way to the tip aperture. Due to the non-adiabaticity of both modes' propagations through the taper below a core radius of 600 nm, there occurs coupling between the modes. The transmission efficiency of the plasmonic mode, including the coupling efficiency and the propagation loss, is expected to be about 10 −6 that is at least 3 orders of magnitude larger than that of the photonic mode. Toward the tip aperture, the longitudinal field of the photonic mode becomes stronger than the transverse ones while the transverse fields always dominate for the plasmonic mode. Experimentally, we obtain polarization resolved images of the near-field at the tip aperture and compare with the x-and y-components of the fundamental quasi-LP plasmonic and photonic modes. The results show that not only the pattern but also the intensity ratios of the x-and y-components of the aperture near-field match with that of the fundamental plasmonic mode. Consequently, we conclude that only the plasmonic mode reaches the tip aperture and thus governs the near-field interaction outside the tip aperture. Our conclusion remains valid for all aperture tips regardless of the cladding metal type that mainly influences the total transmission efficiency of the aperture tip.

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Polarization-Resolved Near-Field Mapping of Plasmonic Aperture Emission by a Dual-SNOM System

Cited by 36 publications

References 49 publications

Image formation properties and inverse imaging problem in aperture based scanning near field optical microscopy

Image formation properties and inverse imaging problem in aperture based scanning near field optical microscopy

Direct manipulation of metallic nanosheets by shear force microscopy

Quasi-linearly polarized hybrid modes in tapered and metal-coated tips with circular apertures: understanding the functionality of aperture tips

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