Polymer Elasticity Analysis with Atomic Force Acoustic Microscopy

Ефимов, А. Е.; Saunin, S. A.; Mescheryakov, N. A.

doi:10.1007/978-1-4020-2402-3_93

Cited by 4 publications

(5 citation statements)

References 4 publications

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“…Other approaches have also been demonstrated. 6,[17][18][19] Our techniques were previously described in the context of quantitative modulus mapping 7 and are based on a digital signal processor architecture. The circuit applies a sweptfrequency sinusoidal voltage to the piezoelectric transducer under the sample.…”

mentioning

confidence: 99%

Mapping substrate/film adhesion with contact-resonance-frequency atomic force microscopy

Hurley¹,

Kopycinska-Müller²,

Langlois³

et al. 2006

Applied Physics Letters

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We have used contact-resonance-frequency atomic force microscopy techniques to nondestructively image variations in adhesion at a buried interface. Images were acquired on a sample containing a 20nm gold (Au) blanket film on silicon (Si) with a 1nm patterned interlayer of titanium (Ti). This design produced regions of very weak adhesion (Si∕Au) and regions of strong adhesion (Si∕Ti∕Au). Values of the contact stiffness were 5% lower in the regions of weak adhesion. The observed behavior is consistent with theoretical predictions for layered systems with disbonds. Our results represent progress towards quantitative measurement of adhesion parameters on the nanoscale.

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mentioning

confidence: 99%

Mapping substrate/film adhesion with contact-resonance-frequency atomic force microscopy

Hurley¹,

Kopycinska-Müller²,

Langlois³

et al. 2006

Applied Physics Letters

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“…9 The oscillations are detected by the optical beam-deflection scheme of an AFM. Since the contact resonance frequency depends on the tip-sample contact stiffness, variations of local elasticity lead to a shift of the resonance frequency.…”

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confidence: 99%

“…This shift can either be used to measure quantitatively the local contact stiffness or to image variation in elastic properties. [6][7][8][9][10][11][12] By insonifying ultrasonic shear waves into the sample causing in-plane surface displacements, torsional resonances of the AFM cantilevers were excited, offering the possibility to gain information on frictional properties or shear elasticity. 2 Using a scanning interferometer, 13 we examined the vibration spectra of cantilevers made of single crystal silicon with approximately rectangular shape.…”

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confidence: 99%

Imaging using lateral bending modes of atomic force microscope cantilevers

Caron

Rabe

Reinstädtler

et al. 2004

Applied Physics Letters

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Using scanning probe techniques, surface properties such as shear stiffness and friction can be measured with a resolution in the nanometer range. The torsional deflection or buckling of atomic force microscope cantilevers has previously been used in order to measure the lateral forces acting on the tip. This letter shows that the flexural vibration modes of cantilevers oscillating in their width direction parallel to the sample surface can also be used for imaging. These lateral cantilever modes exhibit vertical deflection amplitudes if the cantilever is asymmetric in thickness direction, e.g., by a trapezoidal cross section.

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“…Directly combining the single-point AFAM methods described above with two-dimensional scanning is not practical, because lock-in techniques are typically much too slow-requiring perhaps as many as several days for a single image [9]. This problem has previously been addressed by other groups [5,6,9,10]. Our approach to overcoming this difficulty involves new signal acquisition and processing methods based on a 32-bit floating-point digital signal processor (DSP).…”

Section: Experimental Methodsmentioning

confidence: 99%

“…AFM methods that promise quantitative information are usually dynamic approaches in which the AFM cantilever is vibrated at or near the frequencies of its resonant modes. Two of these approaches are contact methods called atomic force acoustic microscopy (AFAM) [3][4][5][6] and ultrasonic AFM [7][8][9][10].…”

Section: Introductionmentioning

confidence: 99%

Nanoscale elastic-property measurements and mapping using atomic force acoustic microscopy methods

Hurley

Kopycinska-Müller

Kos

et al. 2005

Meas. Sci. Technol.

100

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We describe a dynamic atomic force microscopy (AFM) method for measuring the elastic properties of surfaces, thin films and nanostructures at the nanoscale. Our approach is based on atomic force acoustic microscopy (AFAM) techniques and involves the resonant modes of the AFM cantilever in contact mode. From the frequencies of the resonant modes, the tip–sample contact stiffness k* can be calculated. Values for elastic properties such as the indentation modulus M can be determined from k* with appropriate contact-mechanics models. We present the basic principles of AFAM and explain how it can be used to measure local elastic properties with a lateral spatial resolution of tens of nanometres. Quantitative results for a variety of films as thin as 50 nm are given to illustrate our methods. Studies related to measurement accuracy involving the effects of film thickness and tip wear are also described. Finally, we discuss the design and use of electronics to track the contact-resonance frequency. This extension of AFAM fixed-position methods will enable rapid quantitative imaging of nanoscale elastic properties.

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Polymer Elasticity Analysis with Atomic Force Acoustic Microscopy

Cited by 4 publications

References 4 publications

Mapping substrate/film adhesion with contact-resonance-frequency atomic force microscopy

Mapping substrate/film adhesion with contact-resonance-frequency atomic force microscopy

Imaging using lateral bending modes of atomic force microscope cantilevers

Nanoscale elastic-property measurements and mapping using atomic force acoustic microscopy methods

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