“…27,28 Atomic Force Microscopy (AFM) is a widely used technique to study different surfaces including polymers and to obtain their topography maps. 29,30 The self-assembly oen leads to multiscale or hierarchical surface features (i.e., with small-scale roughness imposed on large-scale roughness), to self-affine or even to self-similar (fractal) structures. Note that self-similar and hierarchical structures are not the same.…”