Polynomial coefficient based DC testing of non-linear analog circuits

Sindia, Suraj; Singh, Virendra; Agrawal, Vishwani D.

doi:10.1145/1531542.1531562

Cited by 21 publications

(9 citation statements)

References 9 publications

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“…In polynomial expansion of Non-Linear Analog circuit there exists at least one coefficient that is a monotonic function of all the circuit parameters. In conclusion, from Lemma 1 and Theorem 2, circuit parameter deviations have a bearing on coefficients and the monotonically varying coefficients can be used to detect parametric faults of the circuit parameters [19].…”

Section: Introductionmentioning

confidence: 87%

“…This method necessarily needs the CUT to be linear, as transfer functions are possible only for LTI systems. To extend the above idea to more general non-linear circuits we adopted a strategy in [19] where we expand the function of the circuit as a polynomial by the Taylor's series expansion about the input voltage mangitude v in at a given frequency, as follows:…”

Section: Introductionmentioning

confidence: 99%

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Non-linear analog circuit test and diagnosis under process variation using V-Transform coefficients

Sindia¹,

Agrawal²,

Singh

2011

29th VLSI Test Symposium

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Abstract-Parametric fault testing of non-linear analog circuits based on a new mathematical transform is presented. The VTransform acts on the polynomial expansion of the circuit's function. Its main properties are: 1) to make the polynomial coefficients monotonic, 2) to reduce masking of parametric faults due to process variation, and 3) to increase the sensitivity of polynomial coefficients to the circuit parameter variation, thus enhancing diagnostic resolution. We show that the sensitivity of V-Transform Coefficients (VTC) with respect to circuit parameter variation is up to 3 to 5 times greater than the sensitivity of polynomial coefficients. Fault diagnosis of parametric faults under process variation using VTC is then presented. We also propose a scheme to distinguish between circuit specifications failures due to process variation versus manufacturing defects which manifest as parametric faults. To validate our approach, we apply the test and diagnosis procedures to a benchmark fifth order elliptic filter. We use SPICE program for fault injection, with about 50,000 Monte Carlo simulation runs to demonstrate fault detection-diagnosis under process variation. The test scheme uncovers 95% of all injected single parametric faults whose sizes deviate 5% from the nominal values of circuit components corrected for process variation, while the procedure successfully diagnosed all component faults under ±3σ process variation with 88% confidence level.

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Section: Introductionmentioning

confidence: 87%

Section: Introductionmentioning

confidence: 99%

Non-linear analog circuit test and diagnosis under process variation using V-Transform coefficients

Sindia¹,

Agrawal²,

Singh

2011

29th VLSI Test Symposium

Self Cite

View full text Add to dashboard Cite

show abstract

“…. , a n are all real functions of circuit parameters p k ∀ k. The special case of DC test that detects a subset of faults, was given in a recent paper [30]. Further, we assume that normal parameter variations (normal drift) in a good circuit are within a fraction α of their nominal value, where α << 1.…”

Section: International Test Conferencementioning

confidence: 99%

“…Parametric fault testing of non-linear analog circuits based on a new mathematical transform called V-transform is introduced in [23], [32]. V-transform acts on the polynomial expansion of the circuit's input-output voltage transfer function.…”

Section: V-transform As a Circuit Signaturementioning

confidence: 99%

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High sensitivity test signatures for unconventional analog circuit test paradigms

Sindia

Agrawal

2013

2013 IEEE International Test Conference (ITC)

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Abstract-A method of testing for parametric faults in analog circuits based on a polynomial representation of fault-free function of the circuit is presented. The response of the circuit under test (CUT) is estimated as a polynomial in the root mean square (RMS) magnitude of the applied input voltage at a relevant frequency or DC. The test then classifies the CUT as fault-free or faulty based upon a comparison of the estimated polynomial coefficients with those of the fault-free circuit. The test application needs very little augmentation of the circuit to make it testable as only output parameters are used for classification. The method is validated on an active elliptic filter and is shown to uncover parametric faults causing deviations as small as 5% from nominal values. Fault diagnosis based upon sensitivity of polynomial coefficients at relevant frequencies is discussed. Another type of circuit signatures in the form of probability moments of the output when test input is random noise are also proposed. It is shown that the sensitivity of either signature can be enhanced by a newly proposed nonlinear Vtransform. Finally, an adaptive test framework leveraging from these signatures and the transform technique is shown to improve defect level and yield loss.

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A Statistical Approach of Analog Circuit Fault Detection Utilizing Kolmogorov–Smirnov Test Method

Srimani

Parai

Ghosh

et al. 2020

Circuits Syst Signal Process

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Polynomial coefficient based DC testing of non-linear analog circuits

Cited by 21 publications

References 9 publications

Non-linear analog circuit test and diagnosis under process variation using V-Transform coefficients

Non-linear analog circuit test and diagnosis under process variation using V-Transform coefficients

High sensitivity test signatures for unconventional analog circuit test paradigms

A Statistical Approach of Analog Circuit Fault Detection Utilizing Kolmogorov–Smirnov Test Method

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