Polystyrene by XPS

Way, Wayne K.; Rosencrance, S. W.; Winograd, Nicholas; Shirley, D. A.

doi:10.1116/1.1247712

Cited by 6 publications

(3 citation statements)

References 1 publication

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“…XPS spectra and calculated atomic percentages for both polystyrene and PMMA are in agreement with those previously reported for these materials. [21][22][23][24] Table 1A shows atomic percentages of carbon and oxygen derived from XPS survey spectra. Atomic percentages of carbon and oxygen in single component films are in agreement with the expected stoichiometry.…”

Section: Characterization Of Single-component and Bilayer Filmsmentioning

confidence: 99%

Reconstructing accurate ToF-SIMS depth profiles for organic materials with differential sputter rates

Taylor

Graham

Castner

2015

Analyst

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To properly process and reconstruct 3D ToF-SIMS data from systems such as multi-component polymers, drug delivery scaffolds, cells and tissues, it is important to understand the sputtering behavior of the sample. Modern cluster sources enable efficient and stable sputtering of many organics materials. However, not all materials sputter at the same rate and few studies have explored how different sputter rates may distort reconstructed depth profiles of multicomponent materials. In this study spun-cast bilayer polymer films of polystyrene and PMMA are used as model systems to optimize methods for the reconstruction of depth profiles in systems exhibiting different sputter rates between components. Transforming the bilayer depth profile from sputter time to depth using a single sputter rate fails to account for sputter rate variations during the profile. This leads to inaccurate apparent layer thicknesses and interfacial positions, as well as the appearance of continued sputtering into the substrate. Applying measured single component sputter rates to the bilayer films with a step change in sputter rate at the interfaces yields more accurate film thickness and interface positions. The transformation can be further improved by applying a linear sputter rate transition across the interface, thus modeling the sputter rate changes seen in polymer blends. This more closely reflects the expected sputtering behavior. This study highlights the need for both accurate evaluation of component sputter rates and the careful conversion of sputter time to depth, if accurate 3D reconstructions of complex multi-component organic and biological samples are to be achieved. The effects of errors in sputter rate determination are also explored.

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Section: Characterization Of Single-component and Bilayer Filmsmentioning

confidence: 99%

Reconstructing accurate ToF-SIMS depth profiles for organic materials with differential sputter rates

Taylor

Graham

Castner

2015

Analyst

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“…3 , with a binding energy of 286.2 eV, corresponds to the hydroxyl bonding of the PS–OH. The π–π* shake-up feature at 291.9 eV, characteristic of a pure PS spectrum (continuous magenta line) [ 19 ], is also observed. Fig.…”

Section: Resultsmentioning

confidence: 99%

Identifying the nature of surface chemical modification for directed self-assembly of block copolymers

Evangelio¹,

Gramazio²,

Lorenzoni³

et al. 2017

Beilstein J. Nanotechnol.

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In recent years, block copolymer lithography has emerged as a viable alternative technology for advanced lithography. In chemical-epitaxy-directed self-assembly, the interfacial energy between the substrate and each block copolymer domain plays a key role on the final ordering. Here, we focus on the experimental characterization of the chemical interactions that occur at the interface built between different chemical guiding patterns and the domains of the block copolymers. We have chosen hard X-ray high kinetic energy photoelectron spectroscopy as an exploration technique because it provides information on the electronic structure of buried interfaces. The outcome of the characterization sheds light onto key aspects of directed self-assembly: grafted brush layer, chemical pattern creation and brush/block co-polymer interface.

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“…In particular, after rinsing of PPAA-ST_2 sample in acetone (spectrum PPAA-ST_2I), a little part of π-π * transition component is lost and the carboxylic component increases, but this is the only kind of tested coating that quite resists to acetone treatment (in view of the photolithographic process for lateral patterning). Comparison between all PPAA-ST processes valence band (left) HR spectra and reference valence bands spectra of polystyrene and a plasma-polymerized acrylic acid, reported in literature [32,33] (right-image re-plotted by authors).…”

Section: Copolymermentioning

confidence: 99%

Ultra-Thin Plasma-Polymerized Functional Coatings for Biosensing: Polyacrylic Acid, Polystyrene and Their Co-Polymer

Rivolo¹,

Castellino²,

Frascella³

et al. 2016

Crystalline and Non-Crystalline Solids

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Recently, many efforts have been done to chemically functionalize sensors surface to achieve selectivity towards diagnostics targets, such as DNA, RNA fragments and protein tumoural biomarkers, through the surface immobilization of the related specific receptor. Especially, some kind of sensors such as microcantilevers (gravimetric sensors) and one-dimensional photonics crystals (optical sensors) able to couple Bloch surface waves are very sensitive. Thus, any kind of surface modifications devoted to functionalize them has to be finely controlled in terms of mass and optical characteristics, such as refractive index, to minimize the perturbation, on the transduced signal, that can affect the response sensitivity towards the detected target species. In this work, the study and optimization of ultra-thin plasma polymers and copolymers, compatible with these constrains and obtained from the vapours of acrylic acid containing a carboxylic (−COOH) group and styrene (an aromatic molecule with a vinyl as substituent at the ring), are reported. The obtained plasma polyacrylic acid (PPAA), plasma polystyrene (PPST) and their copolymer (PPAA-ST), characterized through optical contact angle analysis (OCA), Fourier transform infrared (FTIR) spectroscopy in attenuated total reflection (ATR-FTIR), X-ray photoelectrons spectroscopy (XPS), and atomic force microscopy (AFM), are shown to match specific and critical requirements, such as low thickness (∼40 nm) and refractive index (∼1.5), high surface density of reactive groups (10 15-10 16 COOH/cm 2), bioantifouling properties where required, reproducibility, and chemical resistance and stability.

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Polystyrene by XPS

Cited by 6 publications

References 1 publication

Reconstructing accurate ToF-SIMS depth profiles for organic materials with differential sputter rates

Reconstructing accurate ToF-SIMS depth profiles for organic materials with differential sputter rates

Identifying the nature of surface chemical modification for directed self-assembly of block copolymers

Ultra-Thin Plasma-Polymerized Functional Coatings for Biosensing: Polyacrylic Acid, Polystyrene and Their Co-Polymer

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