Population processes in high-pressure inert-gas-mixture lasers

Sorokin, A. R.

doi:10.1007/bf01120145

Cited by 1 publication

(2 citation statements)

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“…This kind of electron energy degradation process is of great importance in understanding phenomena, like electron beam propagation in the atmosphere, population inversion process in a large group of gas lasers, optical emissions occurring in the upper atmosphere, such as aurora and airglow, which happen due to the precipitation of high-energy electrons, etc. [1][2][3][4].…”

Section: Introductionmentioning

confidence: 99%

“…These electrons lose energy via further collisions in the gas. This kind of electron energy degradation process is of great importance Email addresses: vrinda_mukundan@vssc.gov.in (Vrinda Mukundan), anil_bhardwaj@vssc.gov.in, bhardwaj_spl@yahoo.com ( Anil Bhardwaj) in understanding phenomena, like electron beam propagation in the atmosphere, population inversion process in a large group of gas lasers, optical emissions occurring in the upper atmosphere, like aurora and airglow which happen due to the precipitation of high energy electrons, etc [1,2,3,4].…”

Section: Introductionmentioning

confidence: 99%

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Monte Carlo model for electron degradation in xenon gas

Mukundan¹,

Bhardwaj²

2016

Proc. R. Soc. A.

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We have developed a Monte Carlo model for studying the local degradation of electrons in the energy range 9-10 000 eV in xenon gas. Analytically fitted form of electron impact cross sections for elastic and various inelastic processes are fed as input data to the model. The two-dimensional numerical yield spectrum (NYS), which gives information on the number of energy loss events occurring in a particular energy interval, is obtained as the output of the model. The NYS is fitted analytically, thus obtaining the analytical yield spectrum (AYS). The AYS can be used to calculate electron fluxes, which can be further employed for the calculation of volume production rates. Using the yield spectrum, mean energy per ion pair and efficiencies of inelastic processes are calculated. The value for mean energy per ion pair for Xe is 22 eV at 10 keV. Ionization dominates for incident energies greater than 50 eV and is found to have an efficiency of approximately 65% at 10 keV. The efficiency for the excitation process is approximately 30% at 10 keV.

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Section: Introductionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%