Arylene-bridged polysilsesquioxanes are an interesting class of porous materials prepared
by sol−gel processing of ethoxysilane monomers in which there are two or more trialkoxysilyl
groups positioned about an arylene bridging group. The majority of these materials are highly
porous with surface areas as high as 1880 m2/g. In an effort to understand the nature of
porosity in these materials, small-angle X-ray and neutron scattering were employed to
characterize phenylene-, biphenylene-, and terphenylene-bridged polysilsesquioxanes. Phenylene-bridged polysilsesquioxane xerogels and aerogels were also compared to understand
the effect of drying protocol on pore structure. The effect of catalyst concentration is also
reported for the base-catalyzed system. In all cases studied here, we find evidence for domains
in the nanometer range with distinct fractal character. We associate these domains with
porosity rather than microphase separation of organic and inorganic moieties. The nature
of this porosity depends on the bridging group in a systematic way, but is only weakly
dependent on other synthetic parameters such as catalyst type, catalyst concentration, and
drying protocol.