Portable energy-dispersive X-ray fluorescence equipment for the analysis of cultural heritage

Cesáreo, R.

doi:10.1007/s12043-011-0037-z

Cited by 5 publications

(3 citation statements)

References 2 publications

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“…This is usually a popular area of research and this review period has been no exception. 371 The paper contained only seven references but discussed how such instruments can be used for the analysis of porcelains, ceramics, stones and a variety of metallic objects in a non-invasive and non-destructive way. Since these samples are classed as precious, at least in terms of culture and history, there is a necessity to inflict the least damage possible.…”

Section: Depth-profiling and Diffusion Applicationsmentioning

confidence: 99%

Atomic spectrometry update. Industrial analysis: metals, chemicals and advanced materials

Carter

Fisher

Goodall

et al. 2011

J. Anal. At. Spectrom.

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Metals 1.1 Ferrous metals and alloys 1.2 Non-ferrous metals and alloys 2 Chemicals 2.1 Petroleum and petroleum products 2.1.1 Petroleum products -gasoline, diesels, gasohol, exhaust particulates 2.1.2 Fuel -coal, fly ash, particulates/emissions 2.1.3 Oils -crude oil, lubricants 2.1.4 Alternative fuels 2.2 Organic chemicals and solvents 2.2.1 The analysis of archaeological and art objects 2.2.2 LIBS and other laser techniques 2.2.3 Mass spectrometric techniques 2.2.4 Ion beam techniques 2.2.5 Speciation 2.2.6 Extraction, preconcentration and sample introduction 2.3 Inorganic chemicals and acids 2.3.1 Reviews, overviews and CRMs 2.3.2 Cements, concretes and plasters 2.3.3 Matrix modifiers 2.3.4 Forensic applications 2.3.5 Other applications 2.3.6 The analysis of nano-structures 2.3.6.1 Reviews and CRMs 2.3.6.2 Methods of analysis 2.4 Nuclear materials 2.4.1 Reviews and overviews 2.4.2 Nuclear forensic and safeguards applications 2.4.3 Other nuclear applications 3 Advanced materials 3.1 Polymeric materials and composites

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Section: Depth-profiling and Diffusion Applicationsmentioning

confidence: 99%

Atomic spectrometry update. Industrial analysis: metals, chemicals and advanced materials

Carter

Fisher

Goodall

et al. 2011

J. Anal. At. Spectrom.

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show abstract

“…On the other hand, when elements emitting low-energy photons (typically from 2 to about 5 keV) are analyzed, filtering should be avoided. [9] A very common configuration makes use of a Zr transmission filter (absorption edge at 17.99 keV) to suppress the Mo Kβ line (19.6 keV) of the X-ray tube anode obtaining a nearly monochromatic excitation spectrum. [10,11] Another strategy is to use a regenerative monochromatizing filter, where the same element as the anode material is used to preferentially transmit the characteristic K X-rays generated in the anode.…”

Section: Introductionmentioning

confidence: 99%

“…When elements that emit X‐rays from roughly 5 to 35 keV are analyzed, filtering is needed, and sometimes mandatory, to eliminate the low‐energy tail of the incident X‐ray spectrum, which only contributes to the background. On the other hand, when elements emitting low‐energy photons (typically from 2 to about 5 keV) are analyzed, filtering should be avoided …”

Section: Introductionmentioning

confidence: 99%

Detection limits evaluation of a portable energy dispersive X‐ray fluorescence setup using different filter combinations

et al. 2017

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In this paper, we study the performance of a portable energy dispersive X-ray fluorescence spectrometer by making use of different filter configurations at the X-ray tube output. To fulfill this purpose, we systematically investigated how the detection limits (DL) can be improved by applying three different combinations of filters (Al, Cu and Al + Cu) between the X-ray tube and standard reference materials of different average-Z matrices.The obtained results were compared with the DL obtained with a benchtop system with triaxial geometry, considered the benchmark in detection of trace elements in a variety of sample matrices.The major differences occurred for the low-Z matrices, reflecting the increase of DL for elements with emission energies between 5 and 15 keV using filters. Regarding the high-Z matrices, the use of filters did not render an effective improvement in the DL but had a positive effect in diminishing sum peaks that could hinder the evaluation of some elements.

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In situX‐ray Measurement Methods

Stock

2012

Characterization of Materials

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This article reviews in situ x‐ray measurement methods including x‐ray fluorescence (XRF), x‐ray scattering and x‐ray imaging. Three classes of in situ methods are covered: spectroscopy‐based, scattering‐based and imaging approaches. The spectroscopy treatment centers on x‐ray excited analysis of x‐ray fluorescence. The types of in situ characterization relying on x‐ray scattering include: identification and quantification of crystallographic phases present, crystallographic texture (i.e., pole figures; orientation distribution functions, odf), residual stress measurement and crystal defect characterization (x‐ray diffraction topography; rocking curve analysis). X‐ray imaging includes radiography and computed tomography as well as mapping using diffracted or fluorescent signal.

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Portable energy-dispersive X-ray fluorescence equipment for the analysis of cultural heritage

Cited by 5 publications

References 2 publications

Atomic spectrometry update. Industrial analysis: metals, chemicals and advanced materials

Atomic spectrometry update. Industrial analysis: metals, chemicals and advanced materials

Detection limits evaluation of a portable energy dispersive X‐ray fluorescence setup using different filter combinations

In situX‐ray Measurement Methods

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