Positive exchange bias in a Ni80Fe20/Ni Fe1−O thin-film bilayer

Lin, Ko‐Wei; Tzeng, Y.-M.; Guo, Zhuang; Liu, C.-Y.; Lierop, J. van

doi:10.1016/j.jmmm.2006.02.021

Cited by 11 publications

(4 citation statements)

References 8 publications

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“…1(b), which is consistent with the results obtained by X-ray diffraction (XRD). 7) After annealing at 500 C for 2 h, the grains were found to increase in size to between 20 and 50 nm, as shown in Fig. 1(c).…”

Section: Resultsmentioning

confidence: 84%

“…The exchange bias behavior has been described in detail elsewhere. 7) The total MR ratio measured at 77 K is shown in Fig. 4.…”

Section: Resultsmentioning

confidence: 99%

“…A dual-ion-beam deposition technique 7) was used to prepare the NiFe (20 nm)/(Ni,Fe)O (30 nm) bilayers. A Kaufman source was used to focus an argon ion beam onto a commercially available Ni 80 Fe 20 (at.…”

Section: Methodsmentioning

confidence: 99%

“…[1][2][3] This behavior depends strongly on the interfacial conditions 4,5) between the FM and the AF. Our previous works [6][7][8][9][10] have shown the effect that ion-beam bombardment can have on the AF layer by modifying the microstructure and spin orientations. In this work, we investigate the exchange bias and magnetoresistance (MR) properties of NiFe/(Ni,Fe)O bilayers.…”

Section: Introductionmentioning

confidence: 99%

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Thermal Annealing Effects on the Structural, Magnetic, and Magnetotransport Properties of NiFe/(Ni,Fe)O Bilayers

Guo

Tzeng

Lierop

et al. 2009

jjap

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In this study, the exchange bias and magnetoresistance of NiFe/(Ni,Fe)O bilayers were investigated. Transmission electron microscopy has shown that the (Ni,Fe)O single layer is a pure rock-salt solid solution (a = 4.24 angstrom). After annealing at 500 degrees C for 2 h, the (Ni,Fe)O film undergoes a phase transformation from the pure antiferromagnetic (Ni,Fe)O into ferromagnetic Ni (a = 3.53 angstrom) and ferrimagnetic NiFe(2)O(4) (a = 8.29 angstrom) phases. Furthermore, the NiFe/as-deposited (Ni,Fe)O bilayers exhibit a strong temperature dependence of exchange bias field [H(ex) (T)] that increases linearly with decreasing temperature (H(ex) = -30Oe at 150 K). Surprisingly, no H(ex) was observed in the NiFe/ annealed (Ni,Fe)O bilayers, even at 150 K. This indicates that the AF (Ni,Fe)O phase provides stronger exchange coupling than the ferrimagnetic NiFe(2)O(4). Magnetotransport measurements have shown that these NiFe/(Ni,Fe)O bilayers exhibit anisotropic magnetoresistance (AMR). The NiFe/as-deposited (Ni,Fe)O bilayers exhibit a higher MR ratio than the NiFe/annealed (Ni,Fe)O bilayers, which suggests stronger anisotropic electron scattering between the NiFe and (Ni,Fe)O interfaces in the annealed system. (C) 2009 The Japan Society of Applied Physic

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Section: Resultsmentioning

confidence: 84%

“…The exchange bias behavior has been described in detail elsewhere. 7) The total MR ratio measured at 77 K is shown in Fig. 4.…”

Section: Resultsmentioning

confidence: 99%

Section: Methodsmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

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Thermal Annealing Effects on the Structural, Magnetic, and Magnetotransport Properties of NiFe/(Ni,Fe)O Bilayers

Guo

Tzeng

Lierop

et al. 2009

jjap

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In‐plane and perpendicular exchange bias in [Pt/Co]/NiO multilayers

Lin

Guo

Kahwaji

et al. 2007

Physica Status Solidi (a)

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Exchange bias in [Pt/Co]/NiO multilayers were studied as a function of film thickness and [Pt/Co] layer repetition. A strong temperature dependence of the coercivity, Hc, and exchange bias field, Hex, was observed for the thick and thinnest [Pt/Co]/NiO multilayers. While the thinnest [Pt(3 nm)/Co(1.25 nm)]4/NiO multilayers exhibits no in‐plane exchange bias field, a perpendicular Hex⊥ ∼ ‐150 Oe at 80 K was measured. By contrast, the thickest [Pt(12 nm)/Co(10 nm)]1/NiO multilayers exhibited an in‐plane Hex// ∼ ‐600 Oe (with Hex// ∼ ‐1300 Oe at 5 K) with no measurable perpendicular exchange bias field. The estimated interfacial exchange coupling energy implies the effective Co layer thickness contributing to the exchange bias is effective only in Co layer in contact with NiO bottom layer. AC susceptibility and the temperature dependence of Hex show that the a 1.25 nm thick Co component enables perpendicular exchange bias with a reduced blocking temperature TB∼200 K, compared to that (TB∼250 K) for the thick [Pt/Co]/NiO multilayers. This is attributed to disordered CoPt phases that formed due to intermixing between Co and Pt during deposition. (© 2008 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)

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