2021
DOI: 10.1016/j.jnoncrysol.2021.121168
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Post-annealing effects on RF sputtered all-amorphous ZnO/SiC heterostructure for solar-blind highly-detective and ultralow dark-noise UV photodetector

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Cited by 25 publications
(12 citation statements)
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“…Apart from PDCs processed samples, the presence of amorphous phase among SiC particles has also been reported in pressureless, hot‐pressed, and spark plasma sintered samples 34 ,, 36,53,55 . The presence of amorphous phase in the microstructure results in an increase of the electrical resistivity as charge carriers cannot pass through this disordered structure 53,55,66,111 …”
Section: Factors Affecting Electrical Resistivity Of Porous Sic Ceramicsmentioning
confidence: 95%
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“…Apart from PDCs processed samples, the presence of amorphous phase among SiC particles has also been reported in pressureless, hot‐pressed, and spark plasma sintered samples 34 ,, 36,53,55 . The presence of amorphous phase in the microstructure results in an increase of the electrical resistivity as charge carriers cannot pass through this disordered structure 53,55,66,111 …”
Section: Factors Affecting Electrical Resistivity Of Porous Sic Ceramicsmentioning
confidence: 95%
“…The electrical resistivity improved from 5.0 × 10 5 to 1.0 × 10 2 Ω.cm with an increase of the annealing temperature from 1100 to 1600 • C. 111 This improvement of the electrical conductivity is attributed to the transformation of amorphous SiC to crystalline state. Ferhati et al 66 reported a decrease of the electrical resistivity (from 6.15 × 10 5 to 4.87 × 10 5 Ω.cm) in ZnO/SiC interface with the application of annealing process at 500 • C which was attributed to the decrease of defects and increase of interface crystallinity. Kultayeva et al 25 used 20 wt.% polycarbosilane (PCS) as a bonding phase among α-SiC particles and reported the in-situ formation of β-SiC during the sintering at 1300 • C under Ar and N 2 .…”
Section: Effect Of Amorphous Sicmentioning
confidence: 99%
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