2017
DOI: 10.1109/tvlsi.2016.2593902
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Postsilicon Trace Signal Selection Using Machine Learning Techniques

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Cited by 25 publications
(19 citation statements)
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“…Trace buffer is widely used to improve the observability of circuit and thus assist postsilicon debug and analysis [16,[29][30][31]. It is a buffer that traces (records) some of the internal signals in a silicon chip during runtime.…”
Section: Trace Buffermentioning
confidence: 99%
See 1 more Smart Citation
“…Trace buffer is widely used to improve the observability of circuit and thus assist postsilicon debug and analysis [16,[29][30][31]. It is a buffer that traces (records) some of the internal signals in a silicon chip during runtime.…”
Section: Trace Buffermentioning
confidence: 99%
“…• BufferWidth=8: {dcnt [2], ld r, w3 [2], w3[1], w3 [30], w3 [27], w3 [17], w3[13]} • BufferWidth=16: {dcnt [2], ld r, w3 [4], w3 [29], w3 [27], w3 [23], w3 [22], w3 [18], w3 [16], w3 [15], w3 [14], w3 [13], w3 [12], w3 [10], w1 [9], w3[8]} • BufferWidth=32: {dcnt [2], ld r, sa03 [7], sa13 [7], w3 [7], w3 [6], w3 [3], w3 [2], w3[1], w3 [31], w3 [30], w2 [29], w3 [27], w3 [26], w3 [25], w3 [24], w3 [23], w3 [22], w3 [21], w3 [20], w3 [18], w2 [17], w3 [16], w3 [15], w0 [14], w3 [13], w3 [12], w3 [11], w3 [10], w3 [9], w3 [8], w3[0]} …”
Section: (2) Attack With Rtl Implementationmentioning
confidence: 99%
“…There has been recent research on machine learning applications to some areas of post-silicon validation. In [10], authors propose a trace signal simulation-based selection technique that exploits machine learning to efficiently identify a small set of key traceable signals, reducing the simulation cost. An algorithm that applies anomaly detection techniques is proposed in [9] for post-silicon bug diagnosis.…”
Section: Machine Learning In Post-silicon Validationmentioning
confidence: 99%
“…However, use of less simulations to identify the top signals impacts the restoration performance of the final selected set of trace signals. Recently, a learning-based approach [1] has been proposed where it applies machine learning regression techniques to the circuit under test to reduce the overhead of O(N 2 ) simulations by O(N 2 ) fast predictions, where N is the number of flip-flops in the design. However, it still needs O(N ) simulations, typically thousands or millions of simulations of the design, to train the selection model, which limits its applicability on large industry scale circuits.…”
Section: Fast Model Training and Predictionsmentioning
confidence: 99%
“…Rahmani et al [1] proposed an approach that utilizes regression techniques to reduce the number of simulations from O(N 2 ) in Chatterjee et al [6] to O(N ). However, it is still computationally prohibitive in large industry circuits.…”
Section: Background and Motivationmentioning
confidence: 99%