Potential distributions in electroformed MIM and MIMIM structures

Oxley, David; Wild, P.C.

doi:10.1016/0040-6090(74)90019-4

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Low-bias Current-voltage Characteristic1

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2002

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Cited by 14 publications

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“…This is particularly the case when devices exhibit a region of differential negative resistance as reapportionment of the applied bias may give the appearance of sudden switching. This is of even greater importance when compound structures such as triodes are examined as explained by Oxley and Wild [6]. In all of our work described here, the current was monitored using a 1 resistor or a Tektronix current probe, with an insertion impedance of <1 , as described by Thurstans et al [7].…”

Section: Low-bias Current-voltage Characteristicmentioning

confidence: 99%

The electroformed metal-insulator-metal structure: a comprehensive model

Thurstans

Oxley

2002

J. Phys. D: Appl. Phys.

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A new model is presented of the electroformed metal-insulator-metal structure which explains its various properties including electron emission, electroluminescence, memory effects and, for the first time, a complete account of the differential negative resistance. The model is based upon experiments which identify the conduction process to be trap-controlled thermally activated tunnelling between metal islands produced in the forming process. The implications for the production of commercial electroformed devices are discussed.

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Section: Low-bias Current-voltage Characteristicmentioning

confidence: 99%