2005
DOI: 10.1063/1.1891306
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Potential mapping of pentacene thin-film transistors using purely electric atomic-force-microscope potentiometry

Abstract: Potential mapping of organic thin-film transistors (TFTs) has been carried out using originally developed atomic-force-microscope potentiometry (AFMP). The technique is suitable for the accurate measurement at metal–semiconductor boundaries of working TFTs. Potential drops near metal–organic boundaries are observed for both source and drain Au top contacts of a pentacene TFT. The approximate width of the steeper potential slope is 400 nm, which is larger than the spatial resolution of AFMP. The potential drop … Show more

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Cited by 73 publications
(45 citation statements)
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“…31 nm)/Cr (ca. 2 nm) were used as the S/D electrodes, and pentacene thin films, fabricated by using the molecularbeam-deposition technique, [8,9] were used as the active organic semiconductor. The width and length of our transistors was 5000 and 22.9 lm, respectively.…”
mentioning
confidence: 99%
“…31 nm)/Cr (ca. 2 nm) were used as the S/D electrodes, and pentacene thin films, fabricated by using the molecularbeam-deposition technique, [8,9] were used as the active organic semiconductor. The width and length of our transistors was 5000 and 22.9 lm, respectively.…”
mentioning
confidence: 99%
“…The Au is supposed to be scattered by the edge of the shadow mask or residual gas during the vacuum evaporation. This steeper potential slope is therefore due to the electrical damage in pentacene induced by the trace amount of Au [18]. In this case, the apparent mobility was estimated to be about 75% of the intrinsic one.…”
Section: Extrinsic Limiting Factors Of Carrier Mobility In Pentacene mentioning
confidence: 95%
“…Figures 2(a) and 2(b) show atomic-force-microscope potentiometry (AFMP) [3,4,[17][18][19] images taken on a pentacene TC-TFT grown at relatively high temperature, 50°C. The applied drain and gate voltages correspond to the linear regime of the OTFT.…”
Section: Extrinsic Limiting Factors Of Carrier Mobility In Pentacene mentioning
confidence: 99%
“…The shape of the potential profile has been experimentally observed in the operating OFET by using scanning Kelvin probe microscopy (SKPM), giving linear and superlinear distributions corresponding to the linear and the saturation regions of FET output characteristics, respectively. 18 The potential profile also gives detailed information of charge transport, such as contact resistance, [18][19][20][21] charge trapping at grain boundaries, [20][21][22] as well as charge concentration dependence of the mobility. [23][24][25] However, SKPM provides no spectroscopic information of charge carriers.…”
Section: Introductionmentioning
confidence: 99%