In
light of the ongoing debate on the structure of supported vanadia,
we report on a spectral marker enabling the direct identification
of oligomeric surface structures. A series of VO
x
/SiO2/Si(100) planar samples with chemical complexity
was synthesized by spin-coating and investigated in detail by UV resonance
Raman spectroscopy at 256.7 nm excitation as well as by X-ray photoelectron
spectroscopy. The enhanced Raman sensitivity allows vibrational spectra
to be recorded as a function of vanadium loading (0 ≤ L
V ≤ 20.2 V nm–2) despite
the small surface area of the planar model samples. At low loadings
(L
V < 7.3 V nm–2)
the spectra are dominated by dispersed vanadia species, whereas at
higher loadings the presence of crystalline V2O5 is also observed. We identify new spectral features at 492, 562,
and 676 cm–1, which are attributed to V–O–V-related
modes of oligomeric vanadia surface species. The vanadia surface species
show a linear increase with vanadium loading, saturating at a loading
of L
V = 7.3 V nm–2,
at which V2O5 crystallite formation is observed
to increase significantly. Our spectroscopic results are consistent
with a growth model that includes oligomerization of vanadia surface
species to increase the packing density, thereby reducing the number
of V–O–Si linkages to the support.