“…Data for Si, CeO2 and ZrO 2 were collected at the Photon Factory (PF) in Tsukuba, Japan, using a similar powder diffractometer (Uno, Ozawa, Yamanaka, Morikawa, Ando, Ohsumi, Nukui, Yukino & Kawasaki, 1988) and horizontal parallel slits with the same aperture of 0.05 ° (Ohno, 1991). Two scanning modes were used for data collection: one was the symmetric 0-20 scanning and the other the asymmetric 20 scanning with an incident angle ~ fixed at 10 ° for ZrO2 and 5 and 10 °, respectively, for Si and CeO2.…”