Power Measurement and Spectral Test of ZigBee Transmitters from 1-bit Under-sampled Acquisition

Vayssade, T.; Azaïs, Florence; Latorre, Laurent; Lefèvre, François

doi:10.1109/ets.2019.8791540

Cited by 6 publications

(6 citation statements)

References 10 publications

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“…To summarize, the proposed 1-bit under-sampling process produces a digital signal with a fundamental beat frequency at that still contains relevant information on the phase and amplitude of the original RF signal, provided an adequate sampling frequency choice. Regarding postprocessing algorithms, we have already developed solutions for symbol error detection [11] and power and spectral measurements [12]. In this paper, we complete the work by proposing an original algorithm dedicated to EVM measurements.…”

Section: Proposed Digital Test Solutionmentioning

confidence: 99%

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Low-Cost EVM Measurement of ZigBee Transmitters From 1-bit Undersampled Acquisition

Vayssade

Azaïs²,

Latorre

et al. 2021

IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst.

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Error Vector Magnitude (EVM) or alternately Offset Error Vector Magnitude (OEVM) is one of the most important performance to verify for RF circuits such as ZigBee transmitters in order to ensure that the quality of the generated modulated-signal complies with the requirements of the wireless communication standard. The conventional solution to measure this performance relies on the use of an Automatic Test Equipment (ATE) equipped with expensive RF channels. This paper presents a low-cost solution that permits to realize EVM measurement using only a standard digital ATE. The approach is based on 1-bit under-sampled acquisition of the RF modulatedsignal by a digital tester channel associated with a specificallytailored processing algorithm. This algorithm involves many different steps that are detailed in this paper, including phase and amplitude fluctuation extraction, RF signal reconstruction, symbol clock recovery, symbol bits detection and synthesis of reference data for EVM calculation. The proposed digital test solution is first evaluated through lab hardware experiments and then validated with EVM measurements on an industrial ATE.

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Section: Proposed Digital Test Solutionmentioning

confidence: 99%

“…The implemented solution utilizes the work developed in [12] for power measurement using digital test resources. The fundamental basis comes from the principle of level-crossing that converts voltage-domain information into timing information.…”

Section: ) Amplitude Fluctuation Extractionmentioning

confidence: 99%

Low-Cost EVM Measurement of ZigBee Transmitters From 1-bit Undersampled Acquisition

Vayssade

Azaïs²,

Latorre

et al. 2021

IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst.

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“…Finally, power, spectrum and EVM calculations are performed. For details on the implemented functions, refer to [7] for the phase extraction process, [8] for the amplitude extraction, signal reconstruction, power and spectrum calculation processes, and [9] for the EVM calculation process.…”

Section: Post-processing Algorithmmentioning

confidence: 99%

Digital test of ZigBee transmitters: Validation in industrial test environment

Vayssade¹,

Azaïs²,

Latorre³

et al. 2021

2021 Design, Automation &Amp; Test in Europe Conference &Amp; Exhibition (DATE)

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This paper presents the validation of a low-cost solution for production test of ZigBee transmitters in industrial environment. The solution relies on 1-bit acquisition of a 2.4GHz signal with a standard digital ATE channel using harmonic sampling. Dedicated post-processing algorithms are then applied on the low-frequency binary vector captured by the ATE to retrieve the RF signal characteristics and implement the tests specified by IEEE Std 802.15.4. Experimental results collected on more than 1.5 thousand pieces of a ZigBee transceiver from NXP Semiconductors are presented.

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“…Dedicated software procedures have been developed that permit to extract both amplitude and phase fluctuations and therefore allow the reconstruction of the RF signal. Further procedures have then been developed to retrieve the symbol sequence present in the RF signal [11] and perform performance measurements on the reconstructed signal, such as power level measurements and spectral power spectrum evaluation [12]. The proposed solution has been validated through hardware measurements realized both with an experimental lab setup and with an industrial ATE (Advantest V93k).…”

Section: B Indirect Test Based On 1-bit Acquisition With Standard DImentioning

confidence: 99%

Development and Application of Embedded Test Instruments to Digital, Analog/RFs and Secure ICs

Azaïs

Bernard

Comte

et al. 2020

2020 IEEE 26th International Symposium on on-Line Testing and Robust System Design (IOLTS)

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Systems on a chip have seen their surface area increased by a factor of 10 and their consumption multiplied by 5 during the last ten years. Each technological node that enabled this integration has also added new constraints challenging the overall system reliability. In addition, the integration of analog/RF blocks adds specific issues, in particular the high cost of the required test equipment. It is therefore necessary to improve test and reliability solutions in order to guarantee the production yield and the system lifetime. Moreover, the massive increase in the use of communicating systems has introduced security as a cornerstone of their development. The entire hardware production flow is therefore subject to security and trust issues requiring the development of dedicated test solutions. In this paper, we focus on LIRMM contributions in the HADES project especially with details on Embedded Test Instruments (ETIs) for reliability of digital ICs, low-cost RF test based on indirect DC measurements or digital ATE capture, management of secure scan access.

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Power Measurement and Spectral Test of ZigBee Transmitters from 1-bit Under-sampled Acquisition

Cited by 6 publications

References 10 publications

Low-Cost EVM Measurement of ZigBee Transmitters From 1-bit Undersampled Acquisition

Low-Cost EVM Measurement of ZigBee Transmitters From 1-bit Undersampled Acquisition

Digital test of ZigBee transmitters: Validation in industrial test environment

Development and Application of Embedded Test Instruments to Digital, Analog/RFs and Secure ICs

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