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Concentrations of essential and nonessential elements in shoots and storage roots of carrot grown in NaCl and Na2SO4 salinity

“…We used a polarized energy dispersive x-ray fluorescence (PEDXRF) method for essential and nonessential element determinations in carrot shoots and storage roots. X-ray fluorescence spectroscopy has been used before as an analytical tool for plant analysis, [13,14,20,21] and it has the advantages of good sensitivity and nondestructiveness. [21] According to the PEDXRF results, the concentration of Na in the shoots and storage root was increased by both NaCl and Na 2 SO 4 salinity, with the increases being comparatively higher in NaCl salinity than in Na 2 SO 4 salinity.…”

“…The detector of the spectrometer was Si (Li) cooled by liquid N 2 with a resolution of <150 eV at Mn Kα, 5000 cps. [13,14] The spectrometer was calibrated with two standard plant materials (K04-BCR-61 and K04-BCR-62, European Community Bureau of Reference) based on the certificated concentrations of the elements under investigation ( Table 2). Concentrations of the elements in wax ( Table 2) were automatically deducted from each sample.…”

Study of the processes of background formation in the long-wavelength region of X-Ray spectrum

“…0.004 Y l nor = 1.0 + 0.847X 2 + 0.027X 1 X 3 + 0.027X 1 X 2 X 3 (12a) 0.017 P Y s = 0.061 -0.003X 2 (13) 0.001 Y s nor = 1.0 -0.051X 2 (13a) 0.016 Y l = 0.055 -0.003X 2 (14) 0.001 Y l nor = 1.0 -0.050X 2 (14a) 0.018 Y av = 0.058 -0.003X 2 (15) 0.001 Y av nor = 1.0 -0.051X 2 (15a) 0.017 Y l = 0.064 -0.002X 2 + 0.001X 3 (16) 0.001 Y l nor = 1.0 -0.031X 2 + 0.020X 3 (16a) 0.016 S Y s = 0.115 -0.002X 1 -0.005X 2 + 0.009X 3 (17) 0.001 Y s nor = 1.0 -0.019X 1 -0.044X 2 + 0.081X 3 (17a) 0.009 Y l = 0.070 -0.002X 1 -0.003X 2 + 0.003X 3 (18) 0.002 Y l nor = 1.0 -0.031X 1 -0.043X 2 + 0.043X 3 (18a) 0.028 Y av = 0.092 -0.002X 1 -0.004X 2 + 0.003X 3 (19) 0.001 Y av nor = 1.0 -0.024X 1 -0.043X 2 + 0.067X 3 (19a) 0.011 Y l = 0.146 -0.004X 1 -0.006X 2 + 0.004X 3 (20) 0.002 Y l nor = 1.0 -0.025X 1 -0.044X 2 + 0.024X 3 (20a) 0.014 Cl Y s = 0.637 -0.022X 1 -0.047X 2 + 0.002X 3 (21) 0.004 Y s nor = 1.0 -0.034X 1 -0.074X 2 + 0.004X 3 (21a) 0.006 Y l = 0.127 -0.003X 1 -0.007X 2 + 0.009X 3 (22) 0.001 Y l nor = 1.0 -0.022X 1 -0.052X 2 + 0.074X 3 (22a) 0.008 Y av = 0.382 -0.012X 1 -0.027X 2 + 0.006X 3 (23) 0.002 Y av nor = 1.0 -0.032X 1 -0.070X 2 + 0.015X 3 (23a) 0.005 Y l = 0.570 + 0.054X 1 + 0.026X 2 + 0.033X 1 X 2 -0.025X 1 X 3 -0.028X 2 X 3 (24) 0.021 Y l nor = 1.0 + 0.094X 1 + 0.045X 2 + 0.057X 1 X 2 -0.044X 1 X 3 -0.049X 2 X 3 (24a) 0.037 model (3). The influence of CaCO 3 on the background intensity is weak and can be explained by the change in the numerator and denominator of expression (1).…”

“…At the same time, concentrations of some elements in the mineral fraction vary over a wide range: for Na the content reaches 2%; for Ca and K, 6%; and for Al and Si, 10% [17,18]. Such variations of concentrations must affect the process of background formation.…”

Comparison of non-destructive techniques and conventionally used spectrometric techniques for determination of elements in plant samples (coniferous leaves)

“…[17][18][19][20][21] XRF spectrometry provides the possibility of performing direct multielement analysis of solid samples with a wide dynamic range and low cost per measurement. [22][23][24][25][26][27][28][29] By using the XRF technique, it is possible to perform qualitative, semiquantitative, and quantitative determinations within a short time of analysis (high throughput). The limitations for more frequent usage of XRF spectrometry in environmental studies are higher detection limits for some environmentally important elements (e.g., Pb and Cd).…”