2004
DOI: 10.1002/sca.4950260304
|View full text |Cite
|
Sign up to set email alerts
|

Practical method for high‐resolution imaging of polymers by low‐voltage scanning electron microscopy

Abstract: Morphologic characterization of polymers by scanning electron microscopy (SEM) is often made difficult by their sensitivity to electron beam damage. We describe here a specimen preparation method for the imaging of polymer blends by low-voltage SEM (LV-SEM) that improves their stability in the electron beam and hence facilitates focusing and recording of high magnification images. Its application to nanosized core-shell latexes embedded in a polymethylmethacrylate matrix and semi-crystalline polypropylene/ethy… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
1
1

Citation Types

1
5
0

Year Published

2008
2008
2023
2023

Publication Types

Select...
6
2

Relationship

0
8

Authors

Journals

citations
Cited by 15 publications
(6 citation statements)
references
References 26 publications
1
5
0
Order By: Relevance
“…In other words, the contrast in the SEM is due to the differential way electrons interact with the polymer film (insulator) versus the gold substrate (conductor). Similar properties have been described on silicon backgrounds and with block co-polymers39,40,41. The regions where PPS-PEG has been removed therefore appear brighter due to the greater secondary electron signal from gold.…”
Section: Resultssupporting
confidence: 70%
See 1 more Smart Citation
“…In other words, the contrast in the SEM is due to the differential way electrons interact with the polymer film (insulator) versus the gold substrate (conductor). Similar properties have been described on silicon backgrounds and with block co-polymers39,40,41. The regions where PPS-PEG has been removed therefore appear brighter due to the greater secondary electron signal from gold.…”
Section: Resultssupporting
confidence: 70%
“…Similar properties have been described on silicon backgrounds and with block copolymers. [39][40][41] The regions where PPS-PEG has been removed therefore appear to be brighter because of the greater secondary electron signal from gold.…”
Section: Resultsmentioning
confidence: 99%
“…As with thermoplastics, resins are susceptible to deterioration during the observation process under an electron source. In fact, their low electrical conductivity makes them tend to accumulate negative charges on the surface that, among other factors, hinder their analysis by electron microscopy [33]. Therefore, analyses were carried out on selected compounds, including the pristine resin, an intermediate loaded compound (AR-Al15), and the sample with the highest percentage of Al in the composite series (AR-Al30).…”
Section: Structural and Compositional Characterisationmentioning
confidence: 99%
“…Possibly, the dispersion of Sn particles favours surface electrical conductivity, thus reducing this undesirable effect, common in the observation of polymers under electron microscopy. [ 66 ] During the acquisition of spectra, with a longer irradiation time, some areas of the polymer suffered the charging effect but to a lesser extent than in the case of ABS‐Al25 (without Sn addition).…”
Section: Resultsmentioning
confidence: 99%