2016
DOI: 10.1109/mdat.2016.2590985
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Practical Simulation Flow for Evaluating Analog/Mixed-Signal Test Techniques

Abstract: Alternative test techniques are continuously proposed for analog and mixed-signal circuits with the aim to reduce the standard test cost and complexity. One of the main reasons why the majority of these alternative test solutions have not been met with success is the lack of a proof that they will not sacrifice the accuracy of the standard test, resulting in intolerable test escapes and yield loss. In this paper, we target specifically circuits with long simulation times and we present a practical simulation f… Show more

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Cited by 17 publications
(7 citation statements)
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“…DNL, INL, etc., or variations of important design variables [36]. A simulation flow to examine the equivalence of BIST to the standard performance measurement procedure is proposed in [37]. No ADC BIST has been demonstrated for use (a).…”
Section: Related Workmentioning
confidence: 99%
“…DNL, INL, etc., or variations of important design variables [36]. A simulation flow to examine the equivalence of BIST to the standard performance measurement procedure is proposed in [37]. No ADC BIST has been demonstrated for use (a).…”
Section: Related Workmentioning
confidence: 99%
“…Extreme value theory is used in [38] to estimate the performance of the test in the situation where the test boundaries lie in the tails of the distribution. Other techniques such as importance sampling [39] and statistical blockade [40]- [43] rely on altering the selection likelihood of Monte Carlo samples in such a way that sampling is pushed towards the test boundaries. This way we guarantee that the model is trained with both passing and failing devices, mimicking what should be observed in the production line.…”
Section: Machine Learning Indirect Testmentioning
confidence: 99%
“…1 Downloaded from The Designer's Guide (www.designers-guide.org). 12 + V31 * ddt(V(R0D)) -V32 * ddt(V(R1D)); 13 I(R1) <+ -V33 * V(R0) + V34 * V(R1) 14 -V35 * V(TX) -V36 * V(TY) -V37 * V(TZ) 15 + V38 * V(AXD) -V39 * V(AYD) -V40 * V(AZD) 16 -V41 * ddt(V(R0D)) + V42 * ddt(V(R1D)); 17…”
Section: Functionalmentioning
confidence: 99%
“…It is infeasible to test all the possible variations of the values of such parameters since they belong to the domain of real numbers and, thus, can assume an infinite number of values. As a consequence, many works which try to deal with this type of faults have developed techniques which aim at reducing the number of faults that have to be tested [17], [18]. Let us take the code of Listing 1 and in particular the declaration of the parameters R, L and C. Injection of faulty parameters can be can be performed with two types of code manipulations.…”
Section: ) Parametricmentioning
confidence: 99%