1993
DOI: 10.1016/0160-9327(93)90014-t
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Practical surface analysis, second edition. Volume 2 — Ion and neutral spectroscopy

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Cited by 9 publications
(6 citation statements)
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“…29 On the other hand, SSIMS gives us qualitative surface chemistry to a depth of approximately 10 Å and is far more sensitive than XPS. 30 SSIMS information is very complementary to the quantitative results that were obtained by XPS. The combination of XPS and SSIMS is a useful technique Furthermore, the surface structure of PAS films was also visually elucidated by TEM observation and was compared with those that were obtained by XPS and SSIMS.…”
Section: Introductionmentioning
confidence: 91%
“…29 On the other hand, SSIMS gives us qualitative surface chemistry to a depth of approximately 10 Å and is far more sensitive than XPS. 30 SSIMS information is very complementary to the quantitative results that were obtained by XPS. The combination of XPS and SSIMS is a useful technique Furthermore, the surface structure of PAS films was also visually elucidated by TEM observation and was compared with those that were obtained by XPS and SSIMS.…”
Section: Introductionmentioning
confidence: 91%
“…These techniques probe the chemistry of the polymer surface to a depth of between 2 and 10 nm for XPS 19 and approximately 1 nm for SSIMS. 20 The use of both of these techniques to study the composition of biodegradable polymers and polymer blend surfaces is well established. [21][22][23] The analysis of the surface morphology of the polymer blends has been performed using an atomic force microscope (AFM).…”
Section: Introductionmentioning
confidence: 99%
“…6c,d ). The splitting of the Ag 3d doublet is 6.0 eV, implying the presence of metallic Ag 37 . However, Ti 94 Ag 3 Pd 3 had a thinner oxide layer ( Fig.…”
Section: Resultsmentioning
confidence: 97%