2010
DOI: 10.1016/j.scriptamat.2009.10.023
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Precipitate orientation relationships in Pt-implanted sapphire

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Cited by 11 publications
(12 citation statements)
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“…In a prior study, when sapphire was cooled with lN2 during Pt implantation an amorphous surface layer estimated to be ≈ 200 nm thick resulted [25]. In the present study, applying similar implantation conditions to PCA an 240-nm thick amorphized surface layer developed.…”
Section: Post-implantation Characterization Of Pcasupporting
confidence: 60%
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“…In a prior study, when sapphire was cooled with lN2 during Pt implantation an amorphous surface layer estimated to be ≈ 200 nm thick resulted [25]. In the present study, applying similar implantation conditions to PCA an 240-nm thick amorphized surface layer developed.…”
Section: Post-implantation Characterization Of Pcasupporting
confidence: 60%
“…The substrates were not misaligned in order to reduce the orientation-dependence. For implantation with heavy ions the SRIM predictions match experimental implantation depths well, while for medium-light ions (Ar + , Al + , Mg + , He + ) the implantation depth was 15% larger than estimated by SRIM [24,25,26]. In a comparative investigation of ion implantation into sapphire and PCA, the space-charge layer was disturbed by ion implantation, altering the nature of the charge balance and distribution in the near-grain-boundary regions in PCA.…”
Section: Metal Implantationmentioning
confidence: 99%
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“…The nano-precipitates (<100nm diameter) were formed in sapphire by high-energy ion implantation followed by thermal annealing in air. Processing parameters anticipated to yield a large number of Pt precipitates with the orientation relationship (0001) sapphire ||(111) Pt ; [1010] sapphire ||[110] Pt [4,5] were used to produce the specimens. The presence of large numbers of precipitates with this relatively high-symmetry orientation relationship increased the likelihood that interfaces could be studied with both phases simultaneously on a low-index zone axis, as in FIG 1.…”
mentioning
confidence: 99%