Thin films of transition-metal
dichalcogenides are potential materials
for optoelectronic applications. However, the application of these
materials in practice requires knowledge of their fundamental optical
properties. Many existing methods determine optical constants using
predefined models. Here, a different approach was used. We determine
the sheet conductance and absorption coefficient of few-layer PtSe
2
in the infrared and UV–vis ranges without recourse
to any particular model for the optical constants. PtSe
2
samples with a thickness of about 3–4 layers were prepared
by selenization of 0.5 nm thick platinum films on sapphire substrates
at different temperatures. Differential reflectance was extracted
from transmittance and reflectance measurements from the front and
back of the sample. The film thickness, limited to a few atomic layers,
allowed a thin-film approximation to calculate the optical conductance
and absorption coefficient. The former has a very different energy
dependence in the infrared, near-infrared, and visible ranges. The
absorption coefficient exhibits a strong power-law dependence on energy
with an exponent larger than three in the mid-infrared and near-infrared
regions. We have not observed any evidence for a band gap in PtSe
2
thin layers down to an energy of 0.4 eV from our optical
measurements.