Precise measurement of dielectric properties at radio frequencies

Reddish, W.; Bishop, Alexander W.; Buckingham, Katherine; Hyde, P.J.

doi:10.1049/piee.1971.0044

Cited by 20 publications

(1 citation statement)

References 5 publications

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“…There is a long history of development of radio frequency (RF) techniques for measurement of the dielectric loss of very low loss materials (loss angle ≲100 µrad) [1][2][3][4]. Historically, the laboratories of polyethylene manufacturers and national post offices needed such data for evaluation of long-distance-cable communication systems [4,5]. Applications include measurement of the loss angle of materials used as RF windows in accelerators and fusion reactors [6][7][8][9][10][11][12][13].…”

Section: Introductionmentioning

confidence: 99%

Low loss dielectric measurements in the frequency range 1–70 MHz by using a vector network analyser

Gregory¹,

Hill²,

Barnett³

2021

Meas. Sci. Technol.

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The resonance of a coil inductor and a parallel-electrode capacitor can be used to determine the permittivity and loss angle of sheets of material at RF frequencies. By using high-stability instrumentation to measure resonant frequency and Q-factor, the loss angle of very low-loss materials can be determined with a resolution of below 10 microradians. In the 1970s much work went into developing Q-meter-based systems, based on series resonance, which were typically used for measuring the loss angle of polymers such as polyethylene. These systems were also used for measuring ceramics used as RF windows in prototype fusion reactors. This paper describes how one of these systems was updated to replace the now obsolete Q-meter with a vector network analyser (VNA), using parallel resonance. A second aspect to the work is calculation of the fringing (edge) capacitance between the electrodes, which are unguarded, by using MIT FastCap software. This enables measurements obtained by the equivalent-thickness method to be corrected for the effects of fringing capacitance. Measurements using an unmodified Q-meter system, a VNA-based system, and two other techniques are compared for polyethylene, fused silica, macor and alumina specimens. Good agreement is obtained. The measurements are presented with comprehensive evaluations of uncertainty.

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Section: Introductionmentioning

confidence: 99%

Low loss dielectric measurements in the frequency range 1–70 MHz by using a vector network analyser

Gregory¹,

Hill²,

Barnett³

2021

Meas. Sci. Technol.

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Dielectric Measurement

Bartnikas¹

1999

Wiley Encyclopedia of Electrical and Electronics Engineering

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The sections in this article are DC Conductivity Measurements Permittivity and Loss Measurements on Lumped Capacitance Specimens Permittivity and Loss Measurements on Distributed Parameter Specimens Voltage Breakdown Strength Measurements Concluding Remarks

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Dielectric Measurement

Bartnikas¹

2005

Encyclopedia of RF and Microwave Engineering

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Dielectric measurements are concerned with the characterization of solid, liquid, and gaseous insulating materials over a wide range of DC and AC conditions at different frequencies temperatures, field strengths, and pressures, under differing environments. Space does not permit a detailed description of all the dielectric measurement procedures and, consequently, only a cursory presentation is made. Accordingly, the presentation is necessarily confined to a concise description of the most common methods of dielectric measurement employed currently.

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Precise measurement of dielectric properties at radio frequencies

Cited by 20 publications

References 5 publications

Low loss dielectric measurements in the frequency range 1–70 MHz by using a vector network analyser

Low loss dielectric measurements in the frequency range 1–70 MHz by using a vector network analyser

Dielectric Measurement

Dielectric Measurement

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