1983
DOI: 10.1103/physreva.28.858
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Precise measurement of the widths of someLx-ray lines of tungsten

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Cited by 15 publications
(4 citation statements)
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“…Tungsten Lα 1 , Lβ 1 , and Lβ 2 lines (8398 eV, 9673 eV, and 9964 eV [2]) are readily fit in each single-sensor, single-day spectrum of pulse heights. The intrinsic line widths (typically 7 eV FWHM) are estimated from our data, but they are also consistent with published results, where they exist [35,58,59]. The tungsten lines substantially constrain the calibration above 8 keV and are the only constraints above 9 keV.…”
Section: Calibration Features From Transition Metalssupporting
confidence: 90%
“…Tungsten Lα 1 , Lβ 1 , and Lβ 2 lines (8398 eV, 9673 eV, and 9964 eV [2]) are readily fit in each single-sensor, single-day spectrum of pulse heights. The intrinsic line widths (typically 7 eV FWHM) are estimated from our data, but they are also consistent with published results, where they exist [35,58,59]. The tungsten lines substantially constrain the calibration above 8 keV and are the only constraints above 9 keV.…”
Section: Calibration Features From Transition Metalssupporting
confidence: 90%
“…Tungsten Lα 1 , Lβ 1 , and Lβ 2 lines (8398 eV, 9673 eV, and 9964 eV [2]) are readily fit in each single-sensor, single-day spectrum of pulse heights. The intrinsic line widths (typically 7 eV FWHM) are estimated from our data, but they are also consistent with published results, where they exist [58,59,35]. The tungsten lines substantially constrain the calibration above 8 keV and are the only constraints above 9 keV.…”
Section: Calibration Features From Transition Metalssupporting
confidence: 90%
“…The centroids of these characteristic radiation spectra are listed in Table . Also listed in Table are the information on L α lines and the theoretical or literature values of the line widths and positions of the centroids from which the measured emission spectra were calibrated. , The measured full widths at half-maximum (fwhm) of these characteristic spectra were obtained by directly fitting the experimental diffraction profiles with Lorentzian X-ray emission profiles of unknown line widths. When the crystal broadening factor was included, which was estimated to be ∼0.4 eV for L α 1 that was measured by the Si(111) crystal, experimental diffraction profiles could be reproduced using the theoretical line widths and an X-ray source size of 50 μm. , Hence, most of the experimental broadening was caused by the finite source size of the X-ray target.…”
Section: Resultsmentioning
confidence: 99%