Precise Model of the Effective Threshold Voltage Changes in the DLS MOSFETs for Different Gate Angles Compared with Measured Data

Barri, Dalibor; Vacula, Patrik; Kote, Vlastimil; Vacula, Milos; Jakovenko, J.; Voves, J.

doi:10.1109/ae54730.2022.9920095

2022 International Conference on Applied Electronics (AE) 2022

DOI: 10.1109/ae54730.2022.9920095

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Precise Model of the Effective Threshold Voltage Changes in the DLS MOSFETs for Different Gate Angles Compared with Measured Data

Dalibor Barri

Patrik Vacula

Vlastimil Kote

et al.

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Precise Model of the Effective Threshold Voltage Changes in the DLS MOSFETs for Different Gate Angles Compared with Measured Data

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