Deep levels in a narrow bandgap semiconductors are considered detrimental to their electrical performance. Here the constructive role of Indium-induced deep levels in regulating the majority and minority carriers for state-of-theart average thermoelectric figure-of-merit zT ave between 300 and 500 K in narrow bandgap p-type (Bi,Sb) 2 Te 3 is reported. Two compositional series in the pseudo-ternary Bi 2 Te 3-Sb 2 Te 3-In 2 Te 3 phase diagram: Bi 0.475−x Sb 1.525 In x Te 3 (0 ≤ x ≤ 0.15) and Bi 0.475 Sb 1.525−y In y Te 3 (0 ≤ y ≤ 0.10), namely, the x-series and y-series are explored. In the x-series, the combined experimental and theoretical study shows that Indium doping induced donor-like and acceptor-like deep levels, enlarges the band gap, and flattens the conduction band edge, thereby weakening the temperature dependence of Seebeck coefficient and the bipolar heat conduction. Further doping the x-series with copper (aka shallow acceptors) to optimize the majority carrier concentration leads to a state-of-the-art zT ≈ 1.61 at 390 K and record-high average zT ave ≈ 1.47 between 300 and 500 K in p-type Bi 0.396 Sb 1.525 In 0.075 Cu 0.004 Te 3. These results attest to the efficacy of deep levels in narrow bandgap thermoelectrics for both power generation and solid-state refrigeration near room temperature.