2017
DOI: 10.1016/j.solener.2017.03.082
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Precise-tuning the In content to achieve high fill factor in hybrid buffer structured Cu 2 ZnSn(S, Se) 4 solar cells

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Cited by 20 publications
(9 citation statements)
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“…Under such conditions, the concentrations of self-compensated defect clusters [V Cu + Zn Cu ] and [Zn Sn + 2Zn Cu ] are expected to be high 26 . The observed increase in compensation in the absorbers with buffer layers (albeit slight in the case of In 2 S 3 ) could be accounted for by the formation of additional antisite defects such as Cd Cu and In Sn promoted by buffer deposition conditions 29,[58][59][60][61][62][63] . Due to the valencies of Cd and In atoms, antisites Cd Cu and In Sn form donor and acceptor defects, respectively.…”
Section: B Photoluminescence Measurementsmentioning
confidence: 98%
See 1 more Smart Citation
“…Under such conditions, the concentrations of self-compensated defect clusters [V Cu + Zn Cu ] and [Zn Sn + 2Zn Cu ] are expected to be high 26 . The observed increase in compensation in the absorbers with buffer layers (albeit slight in the case of In 2 S 3 ) could be accounted for by the formation of additional antisite defects such as Cd Cu and In Sn promoted by buffer deposition conditions 29,[58][59][60][61][62][63] . Due to the valencies of Cd and In atoms, antisites Cd Cu and In Sn form donor and acceptor defects, respectively.…”
Section: B Photoluminescence Measurementsmentioning
confidence: 98%
“…The increase in doping density in the In 2 S 3 -based device should have an associated V oc improvement of 61 mV. As V oc can be detrimentally affected by high shunt conductance G sh 62,73 , this anomaly can be explained in terms of increased G sh compared to the CdSbased device (G sh (In 2 S 3 ) = 39.3 mS/cm 2 , G sh (CdS) = 9.4 mS/cm 2 ). Similar carrier concentrations were observed in CZTSSe devices with In 2 S 3 buffer layers and CZTSSe absorbers intentionally doped with In 30,62,74 .…”
Section: Electrical Device Characterisationmentioning
confidence: 99%
“…[27] The optimization of device performance can be attributed to the proper concentration of Al cation doping in the CdS buffer layer, which not only alleviated the recombination loss of photo-generated carriers but also improved the carrier transport efficiency. The integrated J SC values were calculated from EQE data according to the following equation: [28] SC…”
Section: Resultsmentioning
confidence: 99%
“…[ 27 ] The optimization of device performance can be attributed to the proper concentration of Al cation doping in the CdS buffer layer, which not only alleviated the recombination loss of photo‐generated carriers but also improved the carrier transport efficiency. The integrated J SC values were calculated from EQE data according to the following equation: [ 28 ] JSCbadbreak=F (λ)EQE(λ)dλ\[ \begin{array}{*{20}{c}}{{J_{{\rm{SC}}}} = \smallint F\;\left( \lambda \right)EQE\left( \lambda \right)d\lambda }\end{array} \] where F(λ) is the photon flux and EQE(λ) is the measured EQE density. The integrated J SC values for A1, A3, and A0 devices were 21.61, 25.33, and 21.10 mA cm −2 , respectively.…”
Section: Resultsmentioning
confidence: 99%
“…The photovoltaics (PV) module is currently being researched to increase electrical output [1]. In terms of methods for improving electrical output, there are studies on increasing the efficiency of c-Si solar cells and reducing the series resistance of solar cells and PV modules [2][3][4].…”
Section: Introductionmentioning
confidence: 99%