2007
DOI: 10.1016/j.mee.2006.08.003
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Predicting mask distortion, clogging and pattern transfer for stencil lithography

Abstract: One of the ultimate tasks for stencil lithography is the ability to fabricate arrays of structures with controlled dimensions on the nanometer scale precisely positioned on a suitable surface. The race to shrink feature sizes requires the limits of conventional lithography to be extended to high-throughput, low cost, reliable and well-controlled processes of which stencilling is a promising candidate for nanoscale applications. Identifying, predicting and overcoming issues accompanying nanostencil lithography … Show more

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Cited by 42 publications
(32 citation statements)
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“…Owing to the direct transfer of the stencil, the thickness of the spin-coated PMMA spacer allows for precise control of the gap between the stencil and the substrate. The gap size has been reported to have a significant impact on the achievable resolution with nanostencil lithography, which is traditionally limited by geometric blurring (blurring from non-normal angle of incidence of material evaporated through the stencil), halo blurring (blurring from surface diffusion of deposited material), and stencil clogging (reduction in stencil aperture size due to deposition of material onto the stencil) 28,29 . For example, feature sizes of ~ 100 nm, and feature resolution down to 25 nm, were reported when the stencil is contacted directly with a flexible substrate, indicative primarily of the potential benefits of reductions in the gap between stencil and substrate 30 .…”
mentioning
confidence: 99%
“…Owing to the direct transfer of the stencil, the thickness of the spin-coated PMMA spacer allows for precise control of the gap between the stencil and the substrate. The gap size has been reported to have a significant impact on the achievable resolution with nanostencil lithography, which is traditionally limited by geometric blurring (blurring from non-normal angle of incidence of material evaporated through the stencil), halo blurring (blurring from surface diffusion of deposited material), and stencil clogging (reduction in stencil aperture size due to deposition of material onto the stencil) 28,29 . For example, feature sizes of ~ 100 nm, and feature resolution down to 25 nm, were reported when the stencil is contacted directly with a flexible substrate, indicative primarily of the potential benefits of reductions in the gap between stencil and substrate 30 .…”
mentioning
confidence: 99%
“…This membrane thickness is required in order to pattern sub-100 nm apertures; however, membranes with such thickness are fragile to physical stress and may suffer deformations and ruptures. 19,33 To increase their stability, the fabricated membranes are corrugated instead of being planar. The corrugations have a hexagonal ring geometry shown in Figure 1b.…”
mentioning
confidence: 99%
“…The blurring is a consequence of the existence of a gap between the stencil and substrate as reported previously on structures deposited by stencil lithography. 16,33,[35][36][37] In order to extract the resistivity of the nanowires, electrical DC measurements at room temperature (∼293 K) were performed using a probe station and a HP parameter analyzer. The resistance of the nanowires was measured keeping the electrical current below 100 µA to prevent wire breakdown.…”
mentioning
confidence: 99%
“…SL also offers the potential for rapid nanopatterning of structures using the stencils several times [3]. However, SL still faces challenges for nanopatterning, like the blurring of the deposited structures due to the stencil-substrate gap [4]. Herein we show advances in the analysis, characterization and application of nanostructures deposited by SL.…”
mentioning
confidence: 96%