2015 IEEE Radiation Effects Data Workshop (REDW) 2015
DOI: 10.1109/redw.2015.7336724
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Predicting Optocoupler Life with Radiation Damage in Various Circuits

Abstract: The effectiveness of using generic proton displacement damage test results to predict the radiation degradation of optocouplers across different circuit applications is presented. Test results are provided for the 4N49 from three lots and compared to a simple model. Estimating the life of circuits using this model is discussed.

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Cited by 5 publications
(1 citation statement)
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“…Protecting low-voltage circuits from potential damage induced by high voltage is paramount due to the distinct voltage requirements of various circuits. [1][2][3][4][5][6] Furthermore, ensuring the safety of electrical devices interacting with the human body remains a critical concern. Henceforth, optical communication emerges as a highly suitable solution.…”
Section: Introductionmentioning
confidence: 99%
“…Protecting low-voltage circuits from potential damage induced by high voltage is paramount due to the distinct voltage requirements of various circuits. [1][2][3][4][5][6] Furthermore, ensuring the safety of electrical devices interacting with the human body remains a critical concern. Henceforth, optical communication emerges as a highly suitable solution.…”
Section: Introductionmentioning
confidence: 99%