2021
DOI: 10.1002/jrs.6117
|View full text |Cite
|
Sign up to set email alerts
|

Predicting Raman line shapes from amorphous silicon clusters for estimating short‐range order

Abstract: A theoretical model obtained based on direct matrix method and bond polarization model (DMM-BPM) has been used to predict Raman scattering line shape for amorphous silicon (a-Si). These line shapes can describe the observed nonunique peak position from these a-Si crystallites, unlike crystalline Si, that varies between 470 and 485 cm −1 . The model has been validated using three different sets of Raman scattering data by fitting it with the proposed model. The Raman spectra are obtained from a-Si samples prepa… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1

Citation Types

0
15
0

Year Published

2021
2021
2024
2024

Publication Types

Select...
6

Relationship

1
5

Authors

Journals

citations
Cited by 17 publications
(15 citation statements)
references
References 68 publications
(101 reference statements)
0
15
0
Order By: Relevance
“…Line shapes of Raman spectra from NSs are expected to be intermediate between those of the corresponding crystalline and amorphous materials. For example, a broad band around 480 cm −1 is observed in the Raman spectra from amorphous Si, [ 81–83 ] whereas at the other extreme in case of c‐Si, a sharp symmetric Lorentzian peak, is observed at ~520.5 cm −1 corresponding to the zone‐centered phonon. Experimental Raman line shape originating from spherical microcrystal was theoretically modeled by Richter et al [ 71 ] by considering the relaxation of crystal momentum in the creation and decay of phonons in the microcrystal, which was later modified by Campbell and Fauchet [ 72 ] for the exact shape of microcrystal vis‐à‐vis spherical, columnar, or thin slab by assigning different order of confinement to the confinement function.…”
Section: Origin Of Asymmetric Raman Line Shape In Siliconmentioning
confidence: 99%
“…Line shapes of Raman spectra from NSs are expected to be intermediate between those of the corresponding crystalline and amorphous materials. For example, a broad band around 480 cm −1 is observed in the Raman spectra from amorphous Si, [ 81–83 ] whereas at the other extreme in case of c‐Si, a sharp symmetric Lorentzian peak, is observed at ~520.5 cm −1 corresponding to the zone‐centered phonon. Experimental Raman line shape originating from spherical microcrystal was theoretically modeled by Richter et al [ 71 ] by considering the relaxation of crystal momentum in the creation and decay of phonons in the microcrystal, which was later modified by Campbell and Fauchet [ 72 ] for the exact shape of microcrystal vis‐à‐vis spherical, columnar, or thin slab by assigning different order of confinement to the confinement function.…”
Section: Origin Of Asymmetric Raman Line Shape In Siliconmentioning
confidence: 99%
“…Later on, DMM-BPM method has been successfully used in Ref. 40 for the description and analysis of amorphous Si Raman data.…”
Section: Introductionmentioning
confidence: 99%
“…While the above analysis has been concentrated on weakly disordered nanocrystals , later on, it has been extended onto the Raman spectra of amorphous silicon. [ 37 ]…”
Section: Introductionmentioning
confidence: 99%
“…While the above analysis has been concentrated on weakly disordered nanocrystals, later on, it has been extended onto the Raman spectra of amorphous silicon. [37] This paper is aimed to demonstrate the practical applicability of the theory developed in previous works [19,20,[34][35][36] as a regular powerful method of interpreting the Raman spectra of nanopowders of nonpolar crystals. The best way to do it is to reexamine existing experiments, extracting from the data precise and detailed information.…”
mentioning
confidence: 99%