Prediction of elastic parameters of photoluminescent porous Si

Doghmane, A.; Hadjoub, I.; Doghmane, M.; Hadjoub, Z.

doi:10.1109/ictonmw.2007.4446967

Cited by 5 publications

(4 citation statements)

References 14 publications

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“…It should be noted that for the permissible range of the Poisson ratio from 0 to 0.5, the Rayleigh velocity varies from 87 to 95 % of transverse velocity. Expression for Young modulus (E) is obtained directly with Rayleigh velocity (V R ) of the form [8]:…”

Section: Thickness Effects On Elastic Constantsmentioning

confidence: 99%

Quantification the Effect of the Thickness of Thin Films on their Elastic Parameters

Gacem

Doghmane

Hadjoub

2011

AMR

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The determination of the characteristics and properties of thin films deposited on substrates is necessary in any device application in various fields. Adequate mechanical properties are highly required for the majority of surface waves and semiconductor devices. In this context, modelling the ultrasonic-material interaction, we present results of simulation curves of acoustic signatures for multiple thin film/substrate combinations. The results obtained on several structures (Al, SiO2, ZnO, Cu, AlN, SiC and Cr)/(Al2O3, Si, Cu or Quartz) showed a velocity dispersion of the Rayleigh wave as a function of layer thickness. The development of a theoretical calculation model based on the acoustic behaviour of these structures has enabled us to quantify the dispersive evolution (positive and negative) density. Thus, we have established a universal relationship describing the density-thickness variation. In addition, networks of dispersion curves, representing the evolution of elasticity modulus (Young and shear), were determined. These charts can be used to extract the influence of thickness of layers on the variation of elastic constants

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Section: Thickness Effects On Elastic Constantsmentioning

confidence: 99%

Quantification the Effect of the Thickness of Thin Films on their Elastic Parameters

Gacem

Doghmane

Hadjoub

2011

AMR

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“…To deal with such a delicate problem, one has to control the film growing mechanisms that require careful optimization of deposition techniques and consequently good understandings of numerous experimental effects. Therefore, a perfect control of all parameters is required to match the growing use of nano-films in modern technological fields [3]. Among important parameters, we mention the mass density, ρ, which greatly affects physical constants [4]- [7].…”

Section: Introductionmentioning

confidence: 99%

Analytical investigation of the variations of nano-film densities with thickness

Gacem

Doghmane

Hadjoub

et al. 2009

2009 3rd ICTON Mediterranean Winter Conference (ICTON-MW)

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In this article, we report an extensive study of mass density variations with increasing thickness of many nanofilms (Al, AlN, Cr, Cu, SiC, SiO 2 , Si 3 N 4 and ZnO) deposited on several substrates (MgO, quartz and stainless steel). From, the analysis and the results quantification, it was found that the mass-density dependence showed dispersive behaviours: increasing layer thickness leads to an initial increase (or decrease) of the density (according to layer/substrate combination) followed by a saturation region. Moreover, we determined analytical density-thickness relations that could be used to determine the mass density of the nanolayer by just knowing its thickness and the bulk density.

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“…We can note that when the porosity increases, the Rayleigh velocity decreases. We calculate the relation between the propagation velocities, using formulas cited in [7,8] we can find V R /V T = 0.918 and V R /V L = 0.55.…”

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confidence: 99%

Theoretical Study of the Mechanical Properties by Using the Acoustic Signature

Bouhedja

Hamdi

2013

AMM

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Acoustic wave propagation in solids can carry valuable information on mechanical properties and is therefore used to determine Young, E, bulk, K and shear, G moduli which depend on longitudinal and transverse velocity VL and VT respectively. In this context acoustic microscopy can successfully be used in the investigations of porous materials. In micro-analysis, it directly determines the mechanical properties of materials via acoustic signature, V (z); this signature is obtained by recording the change in the reflected acoustic signal with the defocusing distance, z, as the sample is moved towards the acoustic lens. In this work, we simulate the porous alumina (PAl2O3) acoustic signature, V (z), as a function of porosity to evaluate the output signal attenuation at different operating frequencies. We continue our simulation by the determining of the propagating velocities as a function of porosity by the use of the fast Fourier transform (FFT). In a large part of this work, our interest concerns the study of the porous alumina microstructure by calculating the elastic constants. We compare then the obtained values of Young and bulk moduli to the published data given by various ultrasound methods.

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Prediction of elastic parameters of photoluminescent porous Si

Cited by 5 publications

References 14 publications

Quantification the Effect of the Thickness of Thin Films on their Elastic Parameters

Quantification the Effect of the Thickness of Thin Films on their Elastic Parameters

Analytical investigation of the variations of nano-film densities with thickness

Theoretical Study of the Mechanical Properties by Using the Acoustic Signature

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