2010
DOI: 10.1063/1.3463208
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Preliminary Commissioning and Performance of the Soft X-ray Micro-characterization Beamline at the Canadian Light Source

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Cited by 79 publications
(63 citation statements)
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“…The Soft X-ray Microcharacterization Beamline (SXRMB, 06B1-1) located at the Canadian Light Source (CLS) was used to collect the Ti K-edge XANES spectra from the damaged and undamaged RE 2 Ti 2 O 7 (RE = Sm, Eu, Gd, Ho, Yb and Y), Yb 1.85 Ca 0.15-Ti 2 O 7Àd , and Yb 2 Ti 1.85 Fe 0.15 O 7Àd materials using a Si(1 1 1) monochromator [53]. This beamline provides a photon flux of 10 11 photons/s and a resolution of 0.5 eV at 4966 eV [53,54].…”
Section: Xanesmentioning
confidence: 99%
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“…The Soft X-ray Microcharacterization Beamline (SXRMB, 06B1-1) located at the Canadian Light Source (CLS) was used to collect the Ti K-edge XANES spectra from the damaged and undamaged RE 2 Ti 2 O 7 (RE = Sm, Eu, Gd, Ho, Yb and Y), Yb 1.85 Ca 0.15-Ti 2 O 7Àd , and Yb 2 Ti 1.85 Fe 0.15 O 7Àd materials using a Si(1 1 1) monochromator [53]. This beamline provides a photon flux of 10 11 photons/s and a resolution of 0.5 eV at 4966 eV [53,54].…”
Section: Xanesmentioning
confidence: 99%
“…This beamline provides a photon flux of 10 11 photons/s and a resolution of 0.5 eV at 4966 eV [53,54]. Spectra from the undamaged materials were collected from powdered materials placed on carbon tape.…”
Section: Xanesmentioning
confidence: 99%
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“…The Si K edge and Ti K edge X-ray absorption near edge structure (XANES) measurements were obtained using the soft X-ray microcharacterization beamline (SXRMB; 06B1-1) at the Canadian Light Source (CLS). 27 The Si K edge spectra were collected using an InSb(111) crystal monochromator, and the Ti K edge spectra were collected using a Si(111) crystal monochromator in total electron yield (TEY). The spectra were calibrated using Si and Ti reference samples.…”
Section: ■ Introductionmentioning
confidence: 99%
“…The medium energy X-ray microprobe end station at the SXRMB (06B1-1) line of the Canadian Light Source (CLS) synchrotron was used to collect the two-dimensional XRF maps and the XANES spectra [17]. The beamline is at a bending magnet source and features a pre-mirror (collimation), double crystal monochromator (fixed exit beam), and a post-mirror configuration, specifically design to provide tender X-rays (1.8-8 keV).…”
Section: Synchrotron Analysismentioning
confidence: 99%