2016
DOI: 10.1016/j.ceramint.2016.01.033
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Preparation and characterization of Al-doped ZnO piezoelectric thin films grown by pulsed laser deposition

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Cited by 50 publications
(8 citation statements)
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“…We observe the excitation of one guided mode for both TE 0 and TM 0 polarizations in all samples. Under the assumption of the isotropic refractive index [6,27], the refractive index and the thickness of the samples are deduced and listed in table 2. TiO 2 :SnO 2 films are thinner than those of TiO 2 (the thickness decreases from 210 nm for TiO 2 to 164 nm for TiO 2 :SnO 2 (6:4) thin films).…”
Section: Waveguiding Measurementsmentioning
confidence: 99%
“…We observe the excitation of one guided mode for both TE 0 and TM 0 polarizations in all samples. Under the assumption of the isotropic refractive index [6,27], the refractive index and the thickness of the samples are deduced and listed in table 2. TiO 2 :SnO 2 films are thinner than those of TiO 2 (the thickness decreases from 210 nm for TiO 2 to 164 nm for TiO 2 :SnO 2 (6:4) thin films).…”
Section: Waveguiding Measurementsmentioning
confidence: 99%
“…technique is an optical method uses to obtain the various guided modes and to determine the different opt-geometric parameters (thickness and refractive index) of waveguiding thin films. [23]. Consequently, we can determine the refractive indices n TE (ordinary refractive index) and n TM (extraordinary refractive index) for the transverse electric (TE) and transverse magnetic (TM) polarizations, and the thickness of films (d).…”
Section: Waveguiding Measurements M-line Spectroscopy (Mls)mentioning
confidence: 99%
“…Determination of the thickness of thin films is a topic of fundamental and technological importance. Therefore, RBS analysis [15,16] is also introduced to measure the thickness, simultaneously with the stoichiometry of TiO 2 films. Fig.…”
Section: Rbs Analysismentioning
confidence: 99%