2006
DOI: 10.1021/jp0642903
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Preparation and Characterization of Copper-Doped Cobalt Oxide Electrodes

Abstract: Cobalt oxide (Co3O4) and copper-doped cobalt oxide (CuxCo(3-x)O4) films have been prepared onto titanium support by the thermal decomposition method. The electrodes have been characterized by different techniques such as cyclic voltammetry, scanning electron microscopy, X-ray diffraction, and X-ray photoelectron spectroscopy (XPS). The effect on the electrochemical and crystallographic properties and surface morphology of the amount of copper in the oxide layer has been analyzed. The XPS spectra correspond to … Show more

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Cited by 176 publications
(122 citation statements)
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“…[28]. The Co 2p XPS spectrum in Figure 6(c) consists of two main lines (2p 3/2 at ~780.6 eV and 2p 1/2 at ~795.7 eV) with the spin-orbit splitting of ~15.1 eV, in accordance with the data reported in the literatures [29,30].…”
Section: Resultssupporting
confidence: 88%
“…[28]. The Co 2p XPS spectrum in Figure 6(c) consists of two main lines (2p 3/2 at ~780.6 eV and 2p 1/2 at ~795.7 eV) with the spin-orbit splitting of ~15.1 eV, in accordance with the data reported in the literatures [29,30].…”
Section: Resultssupporting
confidence: 88%
“…4), considerably contributed to the apparent decrease in internal resistance, consistent with previous reports of enhanced surface conductivity by deposited copper in conventional electrochemical processes [14][15][16]. Similarly, the polarization resistance (R p ) and ohmic resistance (R o ) with both SSM and TS cathodes also diminished with copper deposition over time.…”
Section: Electrochemical Characterization Using Eissupporting
confidence: 88%
“…1) and Cu(II) reduction (Fig. 2) [14]. In contrast, the CS cathode was severely corroded, resulting in remarkable sculptures on the surface, even after cycle 1 (Fig.…”
Section: Morphology Of the Cathode And Product Confirmationmentioning
confidence: 94%
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“…This might be due to the experimental conditions, as the local copperc ontent may exceed that for the stoichiometricCuCo 2 O 4 spinel, which would cause segregation of aC uO phase at the surface, as proposed by Vµzquez. [15] Notably,p ure CuO is not detected in materials with lower copper contents (Co/Cu = 4, 8, and 16), which indicates that coppera toms are successfully incorporated in the spinel phase. Thec rystallite sizes of Co x Cu y O 4 with various copper loadings were calculated by using the Scherrere quation;t hey were found to be approximately 9nmf or all mixed oxides.…”
mentioning
confidence: 95%