Preparation and characterization of d.c.-plated nanocrystalline nickel electrodeposits

Bakonyi, I.; Tóth-Kádár, E.; Pogány, L.; Cziráki, Á.; Geröcs, I.; Varga-Josepovits, Katalin; Arnold, B.; Wetzig, K.

doi:10.1016/0257-8972(94)02399-9

Cited by 67 publications

(47 citation statements)

References 28 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…[58,59] The X-ray DPPA provided: < x > area = 12 nm and < x > vol = 38 nm for the area-and volume-weighted mean crystallite diameters, respectively. [60] Although the TEM image obtained on the same specimen has not been evaluated quantitatively for crystallite or grain size, a good qualitative correlation between the X-ray and TEM results can be observed.…”

Section: When X-ray and Tem Sizes Are In Good Correlationmentioning

confidence: 99%

The Meaning of Size Obtained from Broadened X‐ray Diffraction Peaks

Ungár¹

2003

Adv Eng Mater

View full text Add to dashboard Cite

X‐ray diffraction peak profile analysis (DPPA) is a powerful tool for the characterisation of microstructures either in the bulk or in loose powder materials. The evaluation and modelling procedures have been developed together with the experimental techniques. The dislocation density and structure, as obtained from peak profile analysis, is in good correlation with TEM observations. As for the crystallite size, in some cases a good correlation, however, in other cases definite discrepancies with TEM results can be observed. In the present work those literature data are critically reviewed where crystallite size or grain size have been determined by DPPA and TEM simultaneously. The correlation and discrepancies between DPPA and TEM results are discussed in terms of the microstructures in different types of specimens.

show abstract

Section: When X-ray and Tem Sizes Are In Good Correlationmentioning

confidence: 99%

The Meaning of Size Obtained from Broadened X‐ray Diffraction Peaks

Ungár¹

2003

Adv Eng Mater

View full text Add to dashboard Cite

show abstract

“…For electrodeposited nanocrystalline Ni foils produced by pulse plating onto titanium substrate, XLPA provided ͗x͘ area = 12 nm and ͗x͘ vol = 38 nm for the area-and volume-weighted mean crystallite diameters, respectively ͑Tóth- Kádár et al, 1987;Bakonyi et al, 1996͒. Although the TEM micrograph obtained on the same specimen has not been evaluated quantitatively for crystallite or grain size, a good qualitative correlation between the X-ray and TEM results can be observed ͑Tóth- Kádár et al, 1987;Bakonyi et al, 1996͒. Similar agreement was found for electrodeposited Ni produced by Zhilyaev and co-workers ͑Zhi-lyaev et al, 2003͒.…”

Section: A When X-ray and Tem Sizes Are In Good Agreementmentioning

confidence: 99%

Correlation between subgrains and coherently scattering domains

et al. 2005

View full text Add to dashboard Cite

Crystallite size determined by X-ray line profile analysis is often smaller than the grain or subgrain size obtained by transmission electron microscopy, especially when the material has been produced by plastic deformation. It is shown that besides differences in orientation between grains or subgrains, dipolar dislocation walls without differences in orientation also break down coherency of X-rays scattering. This means that the coherently scattering domain size provided by X-ray line profile analysis provides subgrain or cell size bounded by dislocation boundaries or dipolar walls.

show abstract

“…However, the introduction of a high density of interfaces has an associated energetic penalty, and nanocrystalline materials tend to be unstable with respect to thermally activated structural changes. [9][10][11] The problem of nanostructure stability is most apparent in elemental nanocrystalline metals, such as Ni, 2 Cu, [12][13][14][15][16] Al, 17,18 and Pd, 19,20 which exhibit grain growth at very low homologous temperatures. These materials occupy a far-from-equilibrium state, which can be understood in the thermodynamic context formalized by Gibbs.…”

Section: Introductionmentioning

confidence: 99%

Grain boundary segregation and thermodynamically stable binary nanocrystalline alloys

2009

View full text Add to dashboard Cite

A free-energy function for binary polycrystalline solid solutions is developed based on pairwise nearestneighbor interactions. The model permits intergranular regions to exhibit unique energetics and compositions from grain interiors, under the assumption of random site occupation in each region. For a given composition, there is an equilibrium grain size, and the alloy configuration in equilibrium generally involves solute segregation. The present approach reduces to a standard model of grain boundary segregation in the limit of infinite grain size, but substantially generalizes prior thermodynamic models for nanoscale alloy systems. In particular, the present model allows consideration of weakly segregating systems, systems away from the dilute limit, and is derived for structures of arbitrary dimensionality. A series of solutions for the equilibrium alloy configuration and grain size are also presented as a function of simple input parameters, including temperature, alloy interaction energies, and component grain boundary energies.

show abstract

Preparation and characterization of d.c.-plated nanocrystalline nickel electrodeposits

Cited by 67 publications

References 28 publications

The Meaning of Size Obtained from Broadened X‐ray Diffraction Peaks

The Meaning of Size Obtained from Broadened X‐ray Diffraction Peaks

Correlation between subgrains and coherently scattering domains

Grain boundary segregation and thermodynamically stable binary nanocrystalline alloys

Contact Info

Product

Resources

About