2013
DOI: 10.1063/1.4805042
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Preparation and characterization of Ni(111)/graphene/Y2O3(111) heterostructures

Abstract: Integration of graphene with other materials by direct growth, i.e., not using mechanical transfer procedures, is investigated on the example of metal/graphene/dielectric heterostructures. Such structures may become useful in spintronics applications using graphene as a spin-filter. Here, we systematically discuss the optimization of synthesis procedures for every layer of the heterostructure and characterize the material by imaging and diffraction methods. 300 nm thick contiguous (111) Ni-films are grown by p… Show more

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Cited by 21 publications
(26 citation statements)
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“…The peak position of the CC bond was shifted to lower binding energy by about −0.2, −0.17, −0.1, −0.1, −0.05, and 0 eV for NiCl 2 , CuCl 2 , CoCl 2 , ZnCl 2 , TiCl 3 , and InCl 3 , respectively. The peak shift in the C 1s core‐level position was strongly related to Fermi‐level engineering, suggesting that the observed shift to lower binding energy indicates an increase in the work function of transition‐metal‐doped graphene . The atomic content of carbon and oxygen for each sample is displayed in Fig.…”
Section: Resultsmentioning
confidence: 99%
“…The peak position of the CC bond was shifted to lower binding energy by about −0.2, −0.17, −0.1, −0.1, −0.05, and 0 eV for NiCl 2 , CuCl 2 , CoCl 2 , ZnCl 2 , TiCl 3 , and InCl 3 , respectively. The peak shift in the C 1s core‐level position was strongly related to Fermi‐level engineering, suggesting that the observed shift to lower binding energy indicates an increase in the work function of transition‐metal‐doped graphene . The atomic content of carbon and oxygen for each sample is displayed in Fig.…”
Section: Resultsmentioning
confidence: 99%
“…Indeed, reports of growth on Ni(111) at close to atmospheric pressures (with hydrocarbon partial pressures in the mbar regime) show the formation of inhomogeneous few-layer graphene. 53 , 54 …”
Section: Discussionmentioning
confidence: 99%
“…For the annealed Ni(111) films (Figure e), the height modulation after annealing was only 10 atomic layers, corresponding to approximately 20 Å, on a length scale of 3000 Å. Previous observations with Ni(111) films on other supports, of new holes formed by annealing or even of a complete loss of the metal were not confirmed . The Ir(111) films (Figure d) were even flatter than the Ni(111) films; the Ru(0001) films (Figure f) remained somewhat rougher and showed quite a high density of screw dislocations.…”
Section: Resultsmentioning
confidence: 73%