Thermal degradation and kinetics of polyethersulfone (PES) chips were studied in air, nitrogen, helium, and argon from room temperature to 790°C by highresolution thermogravimetry (TG) at a variable heating rate in response to changes in the sample's degradation rate. In the four atmospheres, a two-step degradation process in air, argon, and helium or a three-step degradation process in nitrogen of the PES were found in this investigation. In particular, the three-step degradation process in nitrogen of the PES revealed by the high-resolution TG was hardly ever observed by a traditional TG. The initial thermal degradation temperature of the PES increases with the testing atmosphere in the following order: air Ͻ argon Ͻ helium Ͻ nitrogen but the activation energy of the first major degradation of PES increases in a different order: argon Ͻ nitrogen Ͻ helium Ͻ air. The degradation temperature, the temperature at the maximum weight-loss rate, the maximum weight-loss rate [(d␣/dT) m1 and (d␣/dT) m2 ], char yield at 790°C, and activation energy of the first major degradation process obtained by the high-resolution TG were compared with those by traditional TG. The PES exhibits the largest (d␣/dT) m1 and the greatest char yield at 790°C in helium but the largest (d␣/dT) m2 and smallest char yield in air. A significant dependency of the thermal decomposition of the polymers on the physicochemical properties (density, thermal conductivity, and oxidative ability) of the testing atmospheres is elaborated for the first time.