Abstract:Abstract. Binary ZnSe thin films were prepared by spin-coating and chemical co-reduction, the effects of reaction conditions on thin films were investigated. The phases of obtained samples were characterized by X-ray diffraction (XRD). The size and morphology of the products were observed by scanning electron microscope (SEM). Experimental results show that, the product sample with high XRD peaks obtained at 200 o C has better crystallinity than those obtained at lower temperatures, which indicates that high t… Show more
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