“…The chemical composition of friction pair surface layer is commonly studied using energy dispersive X-ray spectroscopy (EDS) coupled with scanning electron microscopy, X-ray photoelectron spectroscopy (XPS) and X-ray absorption near edge structure (XANES), while the phase composition and structure characteristics are usually observed through transmission electron microscopy (TEM) and atomic-force microscopy (AFM). Numerous studies have reported that the Si and Mg contents of most friction pairs treated with AMNP (Figure 10, middle image) were significantly higher than that of without AMNP [14,[21][22][23]26,27,[49][50][51][52][53]55,56,61,69,72,77,85,91,[94][95][96][97][98][99]. Some friction pair surfaces treated with AMNP only detected Si but no Mg [17,25,54,55,64,66,74,78,79,84,86,91,95], or only detected Mg but no Si [18,60,100], or neither Si nor Mg were detected [5...…”