2022
DOI: 10.1016/j.ceramint.2022.02.262
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Preparation of Sb2Se3-based ceramics and glass-ceramics from native thin films deposited on Kapton foil

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Cited by 6 publications
(4 citation statements)
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“…The slowdown of the crystalline phase formation may also be explained by the rigidity of the thicker InSe films, not yielding to the macroscopic bending force introduced through the difference in thermal expansion coefficients (CTE Kapton = 20 × 10 –6 °C –1 , CTE InSe = 10–17 × 10 –6 °C –1 ). This internal tensile stress may be the reason for the hindered crystal growth of the highly ordered 2D layers––akin to the changes in the crystal growth behavior recently observed for Se–Te and Sb 2 Se 3 thin films.…”
Section: Discussionmentioning
confidence: 99%
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“…The slowdown of the crystalline phase formation may also be explained by the rigidity of the thicker InSe films, not yielding to the macroscopic bending force introduced through the difference in thermal expansion coefficients (CTE Kapton = 20 × 10 –6 °C –1 , CTE InSe = 10–17 × 10 –6 °C –1 ). This internal tensile stress may be the reason for the hindered crystal growth of the highly ordered 2D layers––akin to the changes in the crystal growth behavior recently observed for Se–Te and Sb 2 Se 3 thin films.…”
Section: Discussionmentioning
confidence: 99%
“…The partition of the two processes at higher d f also indicates that greater InSe film thickness slows down the crystallization (second) process, and progressively, a larger fraction of the 2D-layered structure forms independently, at a higher temperature. The slowdown of the crystalline phase formation may also be explained by the rigidity of the thicker InSe films, not yielding to the macroscopic bending force introduced through the difference in thermal expansion coefficients (CTE Kapton = 20 × 10 −6 °C−1 , 99 tensile stress may be the reason for the hindered crystal growth of the highly ordered 2D layers−−akin to the changes in the crystal growth behavior recently observed for Se−Te 52 and Sb 2 Se 3 53 thin films. Apart from the large difference in the slopes of the Kissinger dependences obtained for the two kinetic peaks, Figure 7B also shows the evolution of T p *s with respect to d f .…”
Section: Discussionmentioning
confidence: 99%
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“…Such measurements did not have the potential to reveal the intricacies associated with the aforementioned aspects influencing the crystal growth in chalcogenide thin films. This was changed only recently by the development of a joint instrumental setup, where the microscopic and calorimetric (specifically using differential scanning calorimetry (DSC)) measurements were performed under identical conditions on as-deposited thin films (i.e., films still attached to the substrate). The high variability of the applicable experimental conditions (achieved by employing DSC in the preparation of samples for microscopy) together with the in situ DSC measurements of as-deposited films represent a huge step forward, compared to the previous approaches limited to the inaccurate and poorly controlled preparation of the microscopic samples and to the DSC measurements of massively altered (scratched-off of the substrates) films.…”
Section: Introductionmentioning
confidence: 99%