To improve the loss properties of Nb anodized thin-film capacitors, Nb-Hf alloy films and Nb-Hf anodized thin-film capacitors were prepared. As an example, various properties of a Nb-Hf (7 at. %) anodized thin-film capacitor with an oxide thickness of 160 nm were compared with those of pure-Nb. It was determined that the loss and leakage current properties of Nb anodized capacitors can be markedly improved by Hf doping while maintaining nearly the same capacitance density and relative permittivity. In addition, it was clarified that improvement in the loss properties of the Nb-Hf (7 at. %) anodized capacitor is due to the formation of a homogeneous complex oxide of Nb 2 O 5 and HfO 2 without lower oxides, as determined by depth analysis by Auger electron spectroscopy.