“…The structure of VTES layers can be significantly different due to the use of different modification methods. At present, researchers have adopted XPS [3,5,13,18,39], IR [3,4,7,11,14,17,23,35,[48][49][50], NMR [8,9,21,22,51], TEM/SEM [4,7,11,13,14,15,22,23,25,27,28,[52][53][54] and TG [9,11,23,24,48] to characterize VTES-SiO 2 , obtaining a series of information of the morphology and size of VTES-SiO 2 , as well as the change of dispersivity, structure of VTES layer and modification mechanism etc.…”