Primary ion fluence dependence in time-of-flight SIMS of self-assembled monolayer of alkyl thiol molecules on Au(111)—Discussion of static limit

Ghonaim, Nour; Nieradko, M.; Ling, Xi; Nie, Heng‐Yong; Francis, Jobin; Grizzi, O.; Yeung, Ken K.‐C.; Lau, Leo W. M.

doi:10.1016/j.apsusc.2008.05.059

Cited by 5 publications

(4 citation statements)

References 19 publications

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“…Alkanethiol SAMs (especially DDT) on Au have been studied using ToF‐SIMS 28–34, 37–39. Fragmentation of DDT SAMs on Au provides numerous characteristic ion fragments.…”

Section: Resultsmentioning

confidence: 99%

“…Time‐of‐flight secondary ion mass spectrometry (ToF‐SIMS)23 evolved in recent years as a fast semiquantitative tool for surface analysis24–26 which found applications in the area of thiol SAMs on Au,25, 27–39 and whose results agree well with other analytical techniques,25, 29 and as such, is suitable for the analysis of the composition of mixed SAMs.…”

Section: Introductionmentioning

confidence: 98%

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Formation and electrochemical desorption of self‐assembled monolayers as studied by ToF‐SIMS

Tencer¹,

Nie²,

Berini³

2011

Surface & Interface Analysis

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Time-of-flight secondary ion mass spectrometry (ToF-SIMS) was used to study a number of processes involving thiol-based self-assembled monolayers (SAMs) on nontextured (polycrystalline) gold (Au) films deposited on Si wafers. ToF-SIMS turned out to be a convenient and versatile semiqualitative technique which readily verified electrochemical desorption of a SAM and formation of another SAM on the same sample via reincubation with another thiol. The technique, allowing one to follow simultaneously more than one species on the surface, showed that any formation of a mixed SAM on surfaces which did not undergo electrolysis was negligible with the applied time scale (minutes).

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“…Alkanethiol SAMs (especially DDT) on Au have been studied using ToF‐SIMS 28–34, 37–39. Fragmentation of DDT SAMs on Au provides numerous characteristic ion fragments.…”

Section: Resultsmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 98%

Formation and electrochemical desorption of self‐assembled monolayers as studied by ToF‐SIMS

Tencer¹,

Nie²,

Berini³

2011

Surface & Interface Analysis

View full text Add to dashboard Cite

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“…The primary ion dose was kept below 10 11 ions/cm 2 to maintain static SIMS conditions. 34 Positive mass spectra were calibrated to CH ), in the low mass region. A number of peaks of increasing mass were assigned and added to the calibration set for an accurate mass calibration.…”

Section: Tof-sims Measurementsmentioning

confidence: 99%

Deposition of intact tetrairon(iii) single molecule magnet monolayers on gold: an STM, XPS, and ToF-SIMS investigation

et al. 2010

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“…Secondary ion mass spectrometry (SIMS) is the only MS method capable of achieving 50-100 nm spatial resolution, thanks to a tightly focused primary ion beam. [42] SIMS has been successfully employed for chemical imaging of surfaces, including thiol SAMS, [43] DNA monolayers, [44] denatured proteins in adsorbed monolayers, [45] and the nanoscale organization of lipid membranes. [46] However, SIMS is limited to analysis under ultra--high vacuum conditions and is only suitable for detecting elemental or very small molecular species (such as CH, CN) since it is a hard ionization method in its high spatial resolution mode.…”

Section: X--ray Based Spectroscopies Because Of Different Core Levelmentioning

confidence: 99%

Tip-enhanced Raman spectroscopy: principles, practice, and applications to nanospectroscopic imaging of 2D materials

2018

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Two-dimensional (2D) materials have been one of the most extensively studied classes of modern materials, due to their astonishing chemical, optical, electronic, and mechanical properties, which are different from their bulk counterparts. The edges, grain boundaries, local strain, chemical bonding, molecular orientation, and the presence of nanodefects in these 2D monolayers (MLs) will strongly affect their properties. Currently, it is still challenging to investigate such atomically thin 2D monolayers with nanoscale spatial resolution, especially in a label-free and non-destructive way. Tip-enhanced Raman spectroscopy (TERS), which combines the merits of both scanning probe microscopy (SPM) and Raman spectroscopy, has become a powerful analytical technique for studying 2D monolayers, because it allows very high-resolution and high-sensitivity local spectroscopic investigation and imaging, and also provides rich chemical information. This review provides a summary of methods to study 2D monolayers and an overview of TERS, followed by an introduction to the current state-of-the-art and theoretical understanding the spatial resolution in TERS experiments. Surface selection rules are also discussed. We then focus on the capabilities and potential of TERS for nanoscale chemical imaging of 2D materials, such as graphene, transition metal dichalcogenides (TMDCs), and 2D polymers. We predict that TERS will become widely accepted and used as a versatile imaging tool for chemical investigation of 2D materials at the nanoscale.

show abstract

Primary ion fluence dependence in time-of-flight SIMS of self-assembled monolayer of alkyl thiol molecules on Au(111)—Discussion of static limit

Cited by 5 publications

References 19 publications

Formation and electrochemical desorption of self‐assembled monolayers as studied by ToF‐SIMS

Formation and electrochemical desorption of self‐assembled monolayers as studied by ToF‐SIMS

Deposition of intact tetrairon(iii) single molecule magnet monolayers on gold: an STM, XPS, and ToF-SIMS investigation

Tip-enhanced Raman spectroscopy: principles, practice, and applications to nanospectroscopic imaging of 2D materials

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